Hi-Deok Lee received B.S., M.S., and Ph.D. degrees from Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea, in 1990, 1992, and 1996, respectively, all in electrical engineering. In 1993, he joined LG Semicon Co., Ltd. (currently SK hynix Semiconductor), Cheongju, Korea, where he was involved in the development of 0.35-, 0.25-, and 0.18-μm CMOS technologies, respectively. He was also responsible for the development of 0.15- and 0.13-μm CMOS technologies. Since 2001, he has been with Chungnam National University, Daejeon, and now is Professor with the Department of Electronics Engineering. From 2006 to 2008, he was with the University of Texas, Austin, and SEMATECH, Austin, as a Visiting Scholar. His research interests are nanoscale CMOS technology and its reliability physics, silicide technology, and test element group design. His research interests also include sensitivity improvement of sensors, and development of high performance sensors. Dr. Lee is a member of the Institute of Electronics Engineers of Korea. He received the Excellent Professor Award from Chungnam National University in 2001, 2003 and 2014.