For a generalized KdV-Burgers-Kuramoto equation we have studied conservation laws by using the multiplier method, and investigated its first-level and second-level potential systems. Furthermore, the Lie point symmetries of the equation and the Lie point symmetries associated with the conserved vectors are determined. We obtain travelling wave reductions depending on the form of an arbitrary function. We present some explicit solutions: soliton solutions, kinks and antikinks.

The Tauc–Lorentz–Urbach (TLU) dispersion model allows us to build a dielectric function from only a few parameters. However, this dielectric function is non-analytic and presents some mathematical drawbacks. As a consequence of this issue, the model becomes inaccurate. In the present work, we will adopt a procedure to conveniently transform the TLU model into a self-consistent dispersion model. The transformation involves the integration of the original TLU imaginary dielectric function ${ϵ}_2$ by using a Lorentzian-type function of semi-width, $\Gamma$. This novel model is analytic and obeys the other necessary mathematical requirements of the optical constants of solid-state materials. The main difference with the non-analytic TLU model occurs at values of the photon energy near or lower than that of the bandgap energy (within the Urbach absorption region). In particular, this new model allows us to reliably extend the optical characterization of amorphous-semiconductor thin films within the limit to zero photon energy. To the best of our knowledge, this is the first time that the analytic TLU model has been successfully used to accurately determine the optical constants of unhydrogenated a-Si films using only their normal-incidence transmission spectra.

Several, nearly-1-µ$\mathrm{m}$-thick, pure, unhydrogenated amorphous-silicon (a-Si) thin layers were grown at high rates by non-equilibrium rf-magnetron Ar-plasma sputtering (RFMS) onto room-temperature low-cost glass substrates. A new approach is employed for the optical characterization of the thin-layer samples, which is based on some new formulae for the normal-incidence transmission of such a samples and on the adoption of the inverse-synthesis method, by using a devised Matlab GUI environment. The so-far existing limiting value of the thickness-non-uniformity parameter, $\Delta d$, when optically characterizing wedge-shaped layers, has been suppressed with the introduction of the appropriate corrections in the expression of transmittance. The optical responses of the H-free RFMS-a-Si thin films investigated, were successfully parameterized using a single, Kramers–Krönig (KK)-consistent, Tauc–Lorentz oscillator model, with the inclusion in the model of the Urbach tail (TLUC), in the present case of non-hydrogenated a-Si films. We have also employed the Wemple–DiDomenico (WDD) single-oscillator model to calculate the two WDD dispersion parameters, dispersion energy, $E_{\mathrm{d}}$, and oscillator energy, $E_{\mathrm{so}}$. The amorphous-to-crystalline mass-density ratio in the expression for $E_{\mathrm{d}}$ suggested by Wemple and DiDomenico is the key factor in understanding the refractive index behavior of the a-Si layers under study. The value of the porosity for the specific rf-magnetron sputtering deposition conditions employed in this work, with an Ar-pressure of ~4.4 Pa, is found to be approximately 21%. Additionally, it must be concluded that the adopted TLUC parameterization is highly accurate for the evaluation of the UV/visible/NIR transmittance measurements, on the H-free a-Si investigated. Finally, the performed experiments are needed to have more confidence of quick and accurate optical-characterizations techniques, in order to find new applications of a-Si layers in optics and optoelectronics.

This paper studies a non-linear viscoelastic wave equation, with non-linear damping and source terms, from the point of view of the Lie groups theory. Firstly, we apply Lie’s symmetries method to the partial differential equation to classify the Lie point symmetries. Afterwards, we reduce the partial differential equation to some ordinary differential equations, by using the symmetries. Therefore, new analytical solutions are found from the ordinary differential equations. Finally, we derive low-order conservation laws, depending on the form of the damping and source terms, and discuss their physical meaning.

In this paper, we consider a fourth‐order nonlinear diffusion partial differential equation, depending on two arbitrary functions. First, we perform an analysis of the symmetry reductions for this parabolic partial differential equation by applying the Lie symmetry method. The invariance property of a partial differential equation under a Lie group of transformations yields the infinitesimal generators. By using this invariance condition, we present a complete classification of the Lie point symmetries for the different forms of the functions that the partial differential equation involves. Afterwards, the optimal systems of one‐dimensional subalgebras for each maximal Lie algebra are determined, by computing previously the commutation relations, with the Lie bracket operator, and the adjoint representation. Next, the reductions to ordinary differential equations are derived from the optimal systems of one‐dimensional subalgebras. Furthermore, we study travelling wave reductions depending on the form of the two arbitrary functions of the original equation. Some travelling wave solutions are obtained, such as solitons, kinks and periodic waves.