Professor Wuqiang Yang (FIEEE, FIET, FInstMC, CEng) received his B.Eng. (Distinction) 1982, M.Sc. 1985, and Ph.D. (Distinction) 1988, from Tsinghua University. After 3 years as a Lecturer at Tsinghua University, he joined UMIST in 1991 and became a Professor in 2005. He is the Director of Business Engagement and Innovation in the Dept. of Electrical and Electronics Engineering. He has published 400 papers and two books and holds 10 patents. In 2006, he received the Global Research Award from the Royal Academy of Engineering and took a sabbatical leave at Massachusetts Institute of Technology (MIT) in the USA as a visiting professor. He organized many special issues as a Guest Editor for IEEE Trans. IM, Meas. Sci. Technol., Sensors and other journals. He is recognized by the International Center for Scientific Research (France) as one of the top 30 technology researchers in the world. His biography has been included in Who's Who in the World, Who's Who in Science and Engineering, and Who's Who in America since 2002.
Research interests: Electrical capacitance tomography, image reconstruction algorithms, and industrial applications. Multiphase flow measurement. Sensors and instrumentation.
Professor Wuqiang Yang (FIEEE, FIET, FInstMC, CEng) received his B.Eng. (Distinction) 1982, M.Sc. 1985, and Ph.D. (Distinction) 1988, from Tsinghua University. After 3 years as a Lecturer at Tsinghua University, he joined UMIST in 1991 and became a Professor in 2005. He is the Director of Business Engagement and Innovation in the Dept. of Electrical and Electronics Engineering. He has published 400 papers and two books and holds 10 patents. In 2006, he received the Global Research Award from the Royal Academy of Engineering and took a sabbatical leave at Massachusetts Institute of Technology (MIT) in the USA as a visiting professor. He organized many special issues as a Guest Editor for IEEE Trans. IM, Meas. Sci. Technol., Sensors and other journals. He is recognized by the International Center for Scientific Research (France) as one of the top 30 technology researchers in the world. His biography has been included in Who's Who in the World, Who's Who in Science and Engineering, and Who's Who in America since 2002.
Research interests: Electrical capacitance tomography, image reconstruction algorithms, and industrial applications. Multiphase flow measurement. Sensors and instrumentation.