We demonstrate experimental data to elucidate the reason for the discrepancies of reported band gap energy (Eg) of Cu2ZnSnSe4 (CZTSe) thin films, i.e., 1.0 or 1.5 eV. Eg of the coevaporated CZTSe film synthesized at substrate temperature (Tsub) of 370 °C, which was apparently phase pure CZTSe confirmed by x-ray diffraction (XRD) and Raman spectroscopy, is found to be around 1 eV regardless of the measurement techniques. However, depth profile of the same sample reveals the formation of ZnSe at CZTSe/Mo interface. On the other hand, Eg of the coevaporated films increases with Tsub due to the ZnSe formation, from which we suggest that the existence of ZnSe, which is hardly distinguishable from CZTSe by XRD, is the possible reason for the overestimation of overall Eg.

The net electricity savings in dwellings and commercial edifices can be substantially enhanced by using BISTPV shrewdly that can pave the way to realize net zero-energy buildings.

Different from conventional photovoltaics, building-integrated photovoltaics needs not only high performance but also a high degree of transparency. Nevertheless, the Cu(In,Ga)Se₂ (CIGS) solar cell has advantages in terms of the highest conversion efficiency and stability among all thin-film-based solar cells. The semitransparent (ST) CIGS solar cell using an ultrathin CIGS absorber on a transparent conducting oxide (TCO) experiences loss in fill factor and open circuit voltage due to the poor grain morphology and CIGS/TCO interface. Thus, these issues must be addressed to realize ST CIGS solar cells. Wide-bandgap (1.5 eV) submicron CIGS-based solar cells were prepared in this study unlike conventional CIGS with a bandgap of 1.2 eV, in order to enhance see-throughness. But such cells demonstrated low conversion efficiency due to the poor grain morphology and absence of back grading. Therefore, for the sake of improving grain morphology and to create back grading, a sulfurized-AgGa (AGS) layer was deposited between CIGS and the indium tin oxide (ITO) back contact. Ag from the AGS layer diffused throughout the absorber and thus ameliorated the grain morphology. However, Ga and S in the AGS layer remained confined near the back contact, therefore resulting in the creation of back grading. Consequently, a solar cell based on 230 nm thick CIGS modified with a 45 nm thick AGS layer exhibited efficiency of 5.94% with averaged visible transmittance over 25%. This is the highest reported efficiency for a ST CIGS solar cell with over 20% visible transparency. The CIGS solar cell based on this novel approach can be a competent candidate for building-integrated semitransparent photovoltaics applications.

Kesterite-structured Cu₂ZnSnSe₄ (CZTSe) is considered as one of the Earth-abundant and non-toxic photovoltaic materials. CZTSe films have been prepared using a single-step co-evaporation method at a relatively low temperature (i.e., below 500 °C). Due to the volatile nature of tin-selenide, the control over substrate temperature (i.e., growth temperature) is very important in terms of the deposition of high-quality CZTSe films. In this regard, the effects of growth temperatures on the CZTSe film morphology were investigated. The suitable temperature range to deposit CZTSe films with Cu-poor and Zn-rich compositions was 380–480 °C. As the temperature increased, the surface roughness of the CZTSe film decreased, which could improve p/n junction properties and associated device performances. Particularly, according to capacitance-voltage (C-V) and derived-level capacitance profiling (DLCP) measurements, the density of interfacial defects of CZTSe film grown at 480 °C showed the lowest value, of the order of ~3 × 10¹⁵ cm⁻³. Regardless of applied growth temperatures, the formation of a MoSe₂ layer was rarely observed, since the growth temperature was not high enough to have a reaction between Mo back contact layers and CZTSe absorber layers. As a result, the photovoltaic (PV) device with CZTSe film grown at 480 °C yielded the best power conversion efficiency of 6.47%. It is evident that the control over film growth temperature is a critical factor for obtaining high-quality CZTSe film prepared by one-step process.