Nagarajan Raghavan is an assistant professor at the Singapore University of Technology and Design (SUTD) in the engineering product development (EPD) pillar. He obtained his PhD (microelectronics, 2012) at the Division of Microelectronics, Nanyang Technological University (NTU), Singapore. His research focuses on reliability assessment, maintenance modeling, characterization, and lifetime prediction of nanoelectronic devices, as well as material design for reliability, uncertainty quantification and prognostics and health management of electromechanical/industrial systems. He is the recipient of the IEEE Electron Device Society (EDS) Early Career Award for 2016, Asia-Pacific recipient for the IEEE EDS PhD Student Fellowship in 2011, and the IEEE Reliability Society Graduate Scholarship Award in 2008. To date, he has authored/co-authored more than 200 international peer-reviewed publications and five invited book chapters. He is currently serving as an Associate Editor for IEEE Access.