Ali M. Albishi (Senior Member, IEEE) was born in Bisha, Saudi Arabia. He received his BSc degree in Electrical Engineering from King Saud University, Riyadh, Saudi Arabia, in 2008, and his MSc and PhD degrees from the University of Waterloo, Waterloo, ON, Canada, in 2012 and 2018, respectively. In 2019, he joined the faculty of the Department of Electrical Engineering at King Saud University as an Assistant Professor. He has authored or co-authored over 27 journal and conference papers on topics related to nondestructive testing and near-field microwave sensors. Dr. Albishi was a recipient of the Best Undergraduate Project Award at King Saud University in 2008. He has served as a reviewer for several journals.