Metal organic chemical vapor deposition is carefully optimized for the growth of pure CuCrO ₂ delafossite coatings on glass substrates.

Transparent conductive oxides (TCOs) constitute a class of materials that combine high electrical conductivity and optical transparency. These features led to the development of the transparent electronics applications, such as flat panel displays, “smart” windows or functional glasses. N-type TCOs dominate the applications market, and the lack of a suitable p-type counterpart limits the fabrication of a completely transparent active device, which might be considered as a technological breakthrough. Among the wide range of p-type candidates, delafossite CuCrO₂ (and its out-of-stoichiometry derivatives) is a promising material to achieve the desired p-type TCO properties as, up to date, it is presenting the foremost trade-off between optical and electrical properties. The present paper covers the research work and the major achievements related to copper chromium delafossite. A comprehensive overview of fabrication methods and opto-electronic properties is presented. The source of doping and the charge carriers transport mechanism are also thoroughly discussed. Graphical abstract

We report on the experimental observation and theoretical study of the bound state resonances in fast atom diffraction at surfaces. In our studies, the $^{4}\mathrm{He}$ atom beam has been scattered from a high-quality LiF(001) surface at very small grazing incidence angles. In this regime, the reciprocal lattice vector exchange with the surface allows transient trapping of the 0.3\char21{}0.5 keV projectiles into the quasistationary states bound by the attractive atom-surface potential well which is only 10 meV deep. Analysis of the linewidths of the calculated and measured resonances reveals that prior to their release, the trapped projectiles preserve their coherence over travel distances along the surface as large as $0.2\text{ }\text{ }$\mu${}\mathrm{m}$, while being in average only at some angstroms in front of the last atomic plane.

We present a grazing incidence fast atom diffraction (GIFAD) study of monolayer graphene on 6H-SiC(0001). This system shows a Moiré-like 13 × 13 superlattice above the reconstructed carbon buffer layer. The averaging property of GIFAD results in electronic and geometric corrugations that are well decoupled; the graphene honeycomb corrugation is only observed with the incident beam parallel to the zigzag direction while the geometric corrugation arising from the superlattice is revealed along the armchair direction. Full-quantum calculations of the diffraction patterns show the very high GIFAD sensitivity to the amplitude of the surface corrugation. The best agreement between the calculated and measured diffraction intensities yields a corrugation height of 0.27 ± 0.03 Å.