Lars Jensen

Lars Jensen


Research Focus & Metrics

Academic Career Length

18Years (2009-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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12 October 2012 in Optics Letters
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Journal Article
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Lars JensenLars Jensen
Lars Jensen
MMMathias Mende
Mathias Mende
SSStefan Schrameyer
Stefan Schrameyer
MJMarco Jupé
Marco Jupé
DRDetlev Ristau
Detlev Ristau
Laser-induced damage in the nanosecond domain has been connected to the heating and breakdown of local defects within the thin film and the various interfaces. Within the femtosecond regime, the damaging events can be traced back to multiphoton-based excitation into the conduction band. When critical electron density is exceeded, an optical breakdown will occur. In this Letter we report on evidence that two-photon absorption also significantly triggers laser-induced damage in Ta2O5 thin films at 532 nm and 8 ns pulse duration. For experimental verification, single layers of Ta2O5/SiO2 mixtures have been analyzed.

22 December 2015 in Applied Optics
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MMMarius Mrohs
Marius Mrohs
Lars JensenLars Jensen
Lars Jensen
SGStefan Günster
Stefan Günster
TAThimotheus Alig
Thimotheus Alig
DRDetlev Ristau
Detlev Ristau
An approach for the measurement of the laser-induced damage threshold with two wavelengths combined was made while testing antireflective coatings for the wavelengths 266 and 532 nm. Samples were made of Al2O3/SiO2 and HfO2/SiO2 ion beam sputtered films. The results show that adding radiation of a second wavelength might lead to a significant reduction of the threshold. The damage morphology of single and dual wavelength tests is very similar and does not suggest an altered damage mechanism. Further investigations indicated that the dual wavelength threshold is a function of the temporal delay of the two pulses.

21 March 2018 in Advanced Optical Technologies
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HLHao Liu
Hao Liu
Lars JensenLars Jensen
Lars Jensen
PMPing Ma
Ping Ma
DRDetlev Ristau
Detlev Ristau
Atomic layer deposition (ALD) facilitates the deposition of coatings with precise thickness, high surface conformity, structural uniformity, and nodular-free structure, which are properties desired in high-power laser coatings. ALD was studied to produce uniform and stable Al2O3and HfO2single layers and was employed to produce anti-reflection coatings for the harmonics (1ω, 2ω, 3ω, and 4ω) of the Nd:YAG laser. In order to qualify the ALD films for high-power laser applications, the band gap energy, absorption, and element content of single layers were characterized. The damage tests of anti-reflection coatings were carried out with a laser system operated at 1ω, 2ω, 3ω, and 4ω, respectively. The damage mechanism was discussed by analyzing the damage morphology and electric field intensity difference. ALD coatings exhibit stable growth rates, low absorption, and rather high laser-induced damage threshold (LIDT). The LIDT is limited by HfO2as the employed high-index material. These properties indicate the high versatility of ALD films for applications in high-power coatings.

11 September 2009 in Optics Express
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Journal Article
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Lars JensenLars Jensen
Lars Jensen
IBIstvan Balasa
Istvan Balasa
HBHolger Blaschke
Holger Blaschke
DRDetlev Ristau
Detlev Ristau
Bound OH- is one major unwanted absorbing impurity causing significant attenuation for certain wavelengths of laser radiation when propagating through fused silica. A wavelength tunable laser calorimeter (LCA) is used to detect dopants and other impurities in optical material. Also, a technique for photothermal absorption measurements is combined with the LCA set-up allowing for a lateral scan of the sample retaining an absolute calibration. Regarding inhomogeneities within the distribution of impurities the combination of both techniques provides a highly sensitive method to investigate in the lateral distribution of OH- content in fused silica.

17 April 2021 in Coatings
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Journal Article
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HBHOLGER BADORRECK
HOLGER BADORRECK
Lars JensenLars Jensen
Lars Jensen
DRDetlev Ristau
Detlev Ristau
MJMarco Jupé
Marco Jupé
For the purpose of a deeper understanding of thin film growth, in the last two decades several groups developed models for simulation on the atomistic scale. Models using molecular dynamics as their simulation method already give results comparable to experiments, however statistical analysis of the simulations themselves are lacking so far, reasoned by the limits imposed by the computational power and parallelization that can only be used in lateral dimensions. With advancements of software and hardware, an increase in simulation speed by a factor of up to 10 can be reached. This allows either larger structures and/or more throughput of the simulations. The paper analyses the significance of increasing the structure size in lateral dimensions and also the repetition of simulations to gain more insights into the statistical fluctuation contained in the simulations and how well the coincidence with the experiment is. For that, glancing angle incidence deposition (GLAD) coatings are taken as an example. The results give important insights regarding the used interaction potential, the structure size and resulting important differences for the density, surface morphology, roughness and anisotropy. While larger structures naturally can reproduce the real world in more detail, the results show which structure sizes are needed for these aspects without wasting computational resources.

1 January 2019
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Conference Paper
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Lars JensenLars Jensen
Lars Jensen
TBTammo Böntgen
Tammo Böntgen
IBIstvan Balasa
Istvan Balasa
An overview on limiting mechanisms for the interaction of pulsed laser radiation with dielectric multi-layer structures and some recent concepts how to go beyond the state-of-the-art.