Model calibration is crucial for optimizing the performance of complex computer models across various disciplines. In the era of Industry 4.0, symbolizing rapid technological advancement through the integration of advanced digital technologies into industrial processes, model calibration plays a key role in advancing digital twin technology, ensuring alignment between digital representations and real‐world systems. This comprehensive review focuses on the Kennedy and O'Hagan (KOH) framework (Kennedy and O'Hagan, Journal of the Royal Statistical Society: Series B 2001; 63(3):425–464). In particular, we explore recent advancements addressing the challenges of the unidentifiability issue while accommodating model inadequacy within the KOH framework. In addition, we explore recent advancements in adapting the KOH framework to complex scenarios, including those involving multivariate outputs and functional calibration parameters. We also delve into experimental design strategies tailored to the unique demands of model calibration. By offering a comprehensive analysis of the KOH approach and its diverse applications, this review serves as a valuable resource for researchers and practitioners aiming to enhance the accuracy and reliability of their computer models.This article is categorized under: Statistical Models > Semiparametric Models Statistical Models > Simulation Models Statistical Models > Bayesian Models

Calibration refers to the estimation of unknown parameters which are present in computer experiments but not available in physical experiments. An accurate estimation of these parameters is important because it provides a scientific understanding of the underlying system which is not available in physical experiments. Most of the work in the literature is limited to the analysis of continuous responses. Motivated by a study of cell adhesion experiments, we propose a new calibration framework for binary responses. Its application to the T cell adhesion data provides insight into the unknown values of the kinetic parameters which are difficult to determine by physical experiments due to the limitation of the existing experimental techniques.

Non-Gaussian observations such as binary responses are common in some computer experiments. Motivated by the analysis of a class of cell adhesion experiments, we introduce a generalized Gaussian process model for binary responses, which shares some common features with standard GP models. In addition, the proposed model incorporates a flexible mean function that can capture different types of time series structures. Asymptotic properties of the estimators are derived, and an optimal predictor as well as its predictive distribution are constructed. Their performance is examined via two simulation studies. The methodology is applied to study computer simulations for cell adhesion experiments. The fitted model reveals important biological information in repeated cell bindings, which is not directly observable in lab experiments.

The Gaussian process is a standard tool for building emulators for both deterministic and stochastic computer experiments. However, application of Gaussian process models is greatly limited in practice, particularly for large-scale and many-input computer experiments that have become typical. We propose a multi-resolution functional ANOVA model as a computationally feasible emulation alternative. More generally, this model can be used for large-scale and many-input non-linear regression problems. An overlapping group lasso approach is used for estimation, ensuring computational feasibility in a large-scale and many-input setting. New results on consistency and inference for the (potentially overlapping) group lasso in a high-dimensional setting are developed and applied to the proposed multi-resolution functional ANOVA model. Importantly, these results allow us to quantify the uncertainty in our predictions. Numerical examples demonstrate that the proposed model enjoys marked computational advantages. Data capabilities, both in terms of sample size and dimension, meet or exceed best available emulation tools while meeting or exceeding emulation accuracy.