Simona Binetti

Prof. Simona Binetti

University of Milano-Bicocca, Department of Material Science via Cozzi 55 , 20126 Milano, Italy
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Research Focus & Metrics

Academic Career Length

36Years (1991-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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30 April 2019 in Frontiers in Chemistry
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Journal Article
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ADAlessia Le Donne
Alessia Le Donne
VTVanira Trifiletti
Vanira Trifiletti
Simona BinettiSimona Binetti
Simona Binetti
At the end of 2017 roughly 1.8% of the worldwide electricity came from solar photovoltaics (PV), which is foreseen to have a key role in all major future energy scenarios with an installed capacity around 5 TW by 2050. Despite silicon solar cells currently rule the PV market, the extremely more versatile thin film-based devices (mainly Cu(In,Ga)Se2 and CdTe ones) have almost matched them in performance and present room for improvement. The low availability of some elements in the present commercially available PV technologies and the recent strong fall of silicon module price below 1 $/Wp focused the attention of the scientific community on cheap earth-abundant materials. In this framework, thin film solar cells based on Cu2ZnSnS4 (CZTS) and the related sulfur selenium alloy Cu2ZnSn(S,Se)4 (CZTSSe) were strongly investigated in the last 10 years. More recently, chalcogenide PV absorbers potentially able to face TW range applications better than CZTS and CZTSSe due to the higher abundance of their constituting elements are getting considerable attention. They are based on both MY2 (where M = Fe, Cu, Sn and Y = S and/or Se) and Cu2XSnY4 (where X = Fe, Mn, Ni, Ba, Co, Cd and Y = S and/or Se) chalcogenides. In this work, an extensive review of emerging earth-abundant thin film solar cells based on both MY2 and Cu2XSnY4 species is given, along with some considerations on the abundance and annual production of their constituting elements.

1 September 2002 in Journal of Applied Physics
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Simona BinettiSimona Binetti
Simona Binetti
SPS. Pizzini
S. Pizzini
ELE. Leoni
E. Leoni
RSR. Somaschini
R. Somaschini
ACA. Castaldini
A. Castaldini
ACA. Cavallini
A. Cavallini
Photoluminescence (PL) and deep level transient spectroscopy (DLTS) measurements were used to study the origin of optical emissions in the 0.8–1.0 eV region of selected oxygen precipitated and dislocated silicon samples. It was shown that the D1 band, present in both types of samples, is the convolution of different sub-bands, narrowly spaced between 0.802 and 0.820 eV. The emission at 0.807 eV, assigned in the literature to dislocations, was found only in samples where dislocations were intentionally generated by plastic deformation or induced by the clustering of self-interstitials generated during the growth of oxide precipitates. A comparison of the results of PL, DLTS, and optical DLTS measurements allows the assignment of levels involved in the radiative recombination processes.

14 May 2009 in Progress in Photovoltaics: Research and Applications
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ADAlessia Le Donne
Alessia Le Donne
MAMaurizio Acciarri
Maurizio Acciarri
Dario NarducciDario Narducci
Dario Narducci
SMStefano Marchionna
Stefano Marchionna
Simona BinettiSimona Binetti
Simona Binetti

1 June 2006 in Journal of Luminescence
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Journal Article
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SMS. Marchionna
S. Marchionna
FMF. Meinardi
F. Meinardi
MAM. Acciarri
M. Acciarri
Simona BinettiSimona Binetti
Simona Binetti
APA. Papagni
A. Papagni
RTR. Tubino
R. Tubino

8 November 2005 in Physica Status Solidi (a)
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SPS. Pizzini
S. Pizzini
MAM. Acciarri
M. Acciarri
Simona BinettiSimona Binetti
Simona Binetti

15 November 2008 in Journal of Applied Physics
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Journal Article
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JLJoris Libal
Joris Libal
SNSara Novaglia
Sara Novaglia
MAMaurizio Acciarri
Maurizio Acciarri
Simona BinettiSimona Binetti
Simona Binetti
RPRoman Petres
Roman Petres
APAleksander Prokopenko
Aleksander Prokopenko
In this work we present a study of a p-type Czochralski-grown Si ingot which was grown using 10% solar grade silicon (SoG-Si). As the SoG-Si contains a relatively high concentration of impurities including phosphorus, the electrical properties of the as-grown wafers from this ingot are affected by both the compensating dopants and other impurities. Measurements of the minority charge carrier lifetime in the as-grown material reveal very low values (4–8μs). The Hall mobilities at room temperature correspond to normal values for Czochralski silicon in the upper part of the ingot (which solidifies first) and decrease significantly toward the bottom of the ingot. Segregation leads to an accumulation of impurities toward the lower parts of the ingot as well as to a stronger increase in phosphorus than of boron, the latter of which results in a high compensation level (i.e., an increasing resistivity). A priori, both effects could be responsible for the degradation of the electrical properties in the lower parts of the ingot, whereas theoretical considerations show that the level of compensation should not cause a strong decrease in Hall mobility at room temperature. Untextured solar cells have been processed from wafers originating from different positions of the ingot. As expected, the phosphorus diffusion leads to a gettering effect: the recombination active impurities are removed out of the wafer volume. This results in relatively high efficiencies (>16%) of the solar cells but does not show a strong correlation between ingot height and cell efficiency. This observation is also confirmed by the high bulk lifetimes (>200μs) measured after the process even for samples originating from the last solidified (lower)part of the ingot. The Hall mobility of samples cut from finished solar cells has been measured and shows the same trend as the as-grown samples, the values for the bottom of the ingot still being very low. With the concentrations of boron and phosphorus studied up to this point, compensation showed no detrimental effect on the cell efficiency of industrial-like solar cells.