Puccinia triticina Eriks. (Pt), the causal agent of wheat (Triticum aestivum L.) leaf rust, is the most widespread disease of common wheat worldwide. In the present study, 83 wheat cultivars from three provinces of China and 36 tester lines with known leaf rust resistance (Lr) genes were inoculated in the greenhouse with 18 Pt pathotypes to identify seedling effective Lr genes. Field tests were also performed to characterize slow leaf rusting responses at the adult plant growth stage in Baoding and Zhoukou in the 2014–15 and 2015–16 cropping seasons. Twelve Lr genes, viz. Lr1, Lr26, Lr3ka, Lr11, Lr10, Lr2b, Lr13, Lr21, Lr34, Lr37, Lr44, and Lr46 either singly or in combination were identified in 41 cultivars. Known Lr genes were not detected in the remaining 42 cultivars. The most commonly identified resistance genes were Lr26 (20 cultivars), Lr46 (18 cultivars), and Lr1 (eight cultivars). Less frequently detected genes included Lr13, Lr34, and Lr37 (each present in four cultivars), Lr10 (three cultivars), and Lr3ka and Lr44 (each in two cultivars). Evidence for the presence of genes Lr11, Lr2b, and Lr21 (each in one cultivar) was also obtained. Seventeen cultivars were found to have slow rusting resistance in both field growing seasons.

Wheat leaf rust, caused by Puccinia triticina (Pt), is a widespread disease of bread wheat worldwide. In the present study, 50 wheat cultivars from Ethiopia and 34 differential lines, mostly near-isogenic lines (NILs) in the background of Thatcher with known resistance genes to leaf rust (Lr), were tested with 14 Pt races in the greenhouse to postulate Lr genes at the seedling stage. Field experiments were also conducted to identify adult plant responses to leaf rust in Baoding in the 2017–2018 and 2018–2019 growing seasons and in Zhoukou in the 2018–2019 growing season. Thirteen Lr genes (Lr1, Lr18, Lr3ka, Lr15, Lr26, Lr20, Lr14a, Lr30, Lr2a, Lr11, Lr34, Lr46, and Lr68) either singly or in combination were found in 39 cultivars. Known Lr genes were not present in the remaining 11 cultivars. Lr1 and Lr46, each in 13 cultivars, and Lr34 in 12 cultivars were the most commonly identified resistance genes. Less frequently identified genes included Lr26 (five cultivars); Lr30 and Lr18 (each present in four cultivars); Lr15, Lr3ka, and Lr2a (each identified in three cultivars); and Lr68 (two cultivars). Evidence for the existence of Lr11, Lr20, and Lr14a (each in one cultivar) was also obtained. Twenty-one cultivars were found to have slow rusting resistance to leaf rust in the field tests. The results should be valuable for cultivar selection with combinations of effective Lr genes and used in breeding new cultivars with improved resistance to leaf rust in Ethiopia and China.

Wheat (Triticum aestivum L.) leaf rust [Puccinia triticina (Pt)] causes devastating yield losses globally. Conceivably, breeding and development of cultivars harboring adult plant resistance (APR) to leaf rust (LR) can be an effective way to manage wheat leaf rust. Particularly, mapping of major quantitative trait loci (QTLs) facilitate breeding of LR resistant cultivars. Here, we have mapped QTLs for APR to LR in wheat using wheat population including 215 F_2:3 lines from a Zhoumai 22/Chinese Spring. Bulked segregation analyse (BSA) and simple sequence repeat (SSR) detection of wheat lines digged out the QTLs for APR to LR. Using Manager QTXb20 and Icimapping 3.2 software, some APR QTLs were mapped in Zhoumai 22/Chinese Spring wheat population. Three QTLs of APR to LR detected and designated QLr.zh-2BS, QLr.zh-4BL and QLr.zh-7DS) explained 12.58–13.58%, 7.02–20.22% and 6.73–21.30% of the phenotypic variation, respectively. QLr.zh-4BL and QLr.zh-7DS were derived from Chinese Spring wheat, whereas QLr.zh-2BS emanated from Zhoumai 22. QLr.zh-4BL and QLr.zh-7DS were mapped close to Lr12 and Lr34, respectively, revealling their close link to these loci, correspondingly. Overall, the QTLs related APR to LR, their flanking markers and associated APR genes identified in this study could be useful to genomic resources and marker-assisted select breeding of LR resistance in wheat.

Wheat stripe rust, triggered by Puccinia striiformis f. sp. tritici, is among the most widespread and damaging wheat (Triticum L.) diseases. The development of cultivars harboring adult plant resistance (APR) to stripe rust is a better approach to control the disease. The current study aimed to map APR to stripe rust via the QTL mapping of 165 F_2–6 recombinant inbred lines (RILs), derivatives of Weimai 8/Zhengzhou 5389. The collection of phenotypic data for the stripe-rust resistance of both parents and all 165 RILs were conducted at Baoding, Hebei Province, during the 2016–2017 cropping seasons, and at Mianyang, Sichuan Province, during the 2017–2018 and 2018–2019 sowing seasons. The RIL populations and parents were also genotyped with 860 pairs of simple-sequence-repeat (SSR) primers to map APR QTLs to stripe-rust resistant. Moreover, a 55K SNP chip was used for small group bulk segregant analysis conducted to locate the genetic map location and concentration of the SNP markers on the wheat genome. Inclusive composite interval mapping (IciMapping 3.2) software identified four QTLs of stripe-rust resistance on chromosomes 1B, 2AS, 2BS, and 7DS, named QYr.wmy-1B, QYr.wmy-2AS, QYr.wmy-2BS, and QYr.wmy-7DS, which significantly explained 11.56–16.64%, 9.35–12.70%, 7.27–9.95%, and 11.49–15.07% of the phenotypic variation, respectively. All these QTLs were found from the resistant parent, Weimai 8. Meanwhile, the QTLs located on chromosomes 1B and 2AS were found close to Yr18 and Yr9, respectively. Furthermore, the results indicated that QYr.wmy-1B is possibly Yr9 and QYr.wmy-2AS is similar to Yr18 or might be a new QTL, whilst QYr.wmy-2BS and QYr.wmy-7DS were found to be different from previously reported stripe-rust-resistance QTLs and are possibly new QTLs. Overall, the QTLs and their closely associated molecular markers detected in this study could be a great source of input for marker-assisted selection to adult plant stripe-rust resistance in wheat-breeding programs.