Investigation and removal of unnatural variation in the processes of manufacturing, production and services require application of statistical process control. Control charts are the most famous and commonly used statistical process control tools to trace changes in the manufacturing and nonmanufacturing processes parameter(s). The nonparametric control charts become necessary when the distribution of underlying process is unknown or questionable. The nonparametric charts are robust alternative along with holding property of quick shift detection ability in process parameter(s). In this article, we have proposed nonparametric double exponentially weighted moving average chart based on Wilcoxon signed rank test under simple and ranked set sampling schemes for efficient monitoring of the process location. The proposed control charts are compared with classical exponentially weighted moving average, double exponentially weighted moving average, nonparametric exponentially weighted moving average sign, nonparametric exponentially weighted moving average signed rank, nonparametric cumulative sum signed rank charts using average run length and some other characteristics of run length distribution as performance measures. Comparison reveals that the proposed control charts performs better to detect all kinds of shifts in the process location than existing counterparts. A real-life application related to manufacturing process (the variable of interest is the diameter of piston ring) is also provided for the practical implementation of the proposed chart.

Statistical process control (SPC) tools are used for the investigation and identification of unnatural variations in the manufacturing, industrial, and service processes. The control chart, the basic and the most famous tool of SPC, is used for process monitoring. Generally, control charts are constructed under normality assumption of the quality characteristic of interest, but in practice, it is quite hard to hold the normality assumption. In such situations, parametric charts tend to offer more frequent false alarms and invalid out-of-control performance. To rectify these problems, non-parametric control charts are used, as these have the same in-control run length properties for all the continuous distributions and are known as in-control robust. This study intends to develop a new non-parametric exponentially weighted moving average (NPEWMA) chart based on sign statistics under a ranked set sampling scheme that is hereafter named (NPREWMA-SN). The run-length profiles of the NPREWMA-SN chart are computed using the Monte Carlo simulation method. The proposed scheme is compared with NPEWMA-SN and classical EWMA-$\overline{X}$ charts, using different run length measures. The comparison reveals the in-control robustness and superiority of the proposed scheme over its competitors in detecting all kinds of shifts in the process location. A practical application related to the substrate manufacturing process is included to show the demonstration of the proposed chart.

To detect sustainable changes in the manufacturing processes, memory-type charting schemes are frequently functioning. The recently designed, homogenously weighted moving average (HWMA) technique is effective for identifying substantial changes in the processes. To make the HWMA chart more effective for persistent shifts in the industrial processes, a double HWMA (DHWMA) chart has been proposed recently. This study intends to develop a triple HWMA (THWMA) chart for efficient monitoring of the process mean under zero- and steady-state scenarios. The non-normal effects of monitoring characteristics under in-control situations for heavy-tailed highly skewed and contaminated normal environments are computed under both states. The relative efficiency of the proposed structure is compared with HWMA, DHWMA, exponentially weighted moving average (EWMA), double EWMA, and the more effective triple EWMA control charting schemes. The relative analysis reveals that the proposed THWMA design performs more efficiently than the existing counterparts. An illustrative application related to substrate manufacturing is also incorporated to demonstrate the proposal.