Tomasz Szoplik

Prof. Dr. Tomasz Szoplik

Faculty of Physics, University of Warsaw, Poland
orcid

Research Focus & Metrics

Academic Career Length

24Years (2003-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 November 2017 in Applied Surface Science
Verified
Journal Article
Closed access
CACiesielski Sylweester Arkadiusz
Ciesielski Sylweester Arkadiusz
LSLukasz Skowronski
Lukasz Skowronski
MTMarek Trzcinski
Marek Trzcinski
Tomasz SzoplikTomasz Szoplik
Tomasz Szoplik

11 March 2013 in Optics Letters
Verified
Journal Article
Closed access
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MSMarcin Stolarek
Marcin Stolarek
DYDmitriy Yavorskiy
Dmitriy Yavorskiy
RKRafał Kotyński
Rafał Kotyński
CRCarlos J. Zapata Rodríguez
Carlos J. Zapata Rodríguez
JŁJerzy Łusakowski
Jerzy Łusakowski
Tomasz SzoplikTomasz Szoplik
Tomasz Szoplik
We report on experimental evidence of unidirectional transmission of terahertz waves through a pair of metallic gratings with different periods. The gratings are optimized for a broadband transmission in one direction, accompanied with a high extinction rate in the opposite direction. In contrast to previous studies, we show that the zero-order nonreciprocity cannot be achieved. Nonetheless, we confirm that the structure can be used successfully as an asymmetric filter.

1 July 2018 in Materials Science in Semiconductor Processing
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Journal Article
Closed access
CACiesielski Sylweester Arkadiusz
Ciesielski Sylweester Arkadiusz
LSLukasz Skowronski
Lukasz Skowronski
WPWojciech Pacuski
Wojciech Pacuski
Tomasz SzoplikTomasz Szoplik
Tomasz Szoplik

1 August 2018 in Surface Science
Verified
Journal Article
Closed access
CACiesielski Sylweester Arkadiusz
Ciesielski Sylweester Arkadiusz
LSLukasz Skowronski
Lukasz Skowronski
MTMarek Trzcinski
Marek Trzcinski
EGEwa Górecka
Ewa Górecka
PTPaweł Trautman
Paweł Trautman
Tomasz SzoplikTomasz Szoplik
Tomasz Szoplik

31 March 2014 in Discover Nano
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Journal Article
Open access
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TSTomasz Stefaniuk
Tomasz Stefaniuk
Piotr WróbelPiotr Wróbel
Piotr Wróbel
EGEwa Górecka
Ewa Górecka
Tomasz SzoplikTomasz Szoplik
Tomasz Szoplik
Reduction of surface plasmon-polariton losses due to their scattering on metal surface roughness still remains a challenge in the fabrication of plasmonic devices for nanooptics. To achieve smooth silver films, we study the dependence of surface roughness on the evaporation temperature in a physical vapor deposition process. At the deposition temperature range 90 to 500 K, the mismatch of thermal expansion coefficients of Ag, Ge wetting layer, and sapphire substrate does not deteriorate the metal surface. To avoid ice crystal formation on substrates, the working temperature of the whole physical vapor deposition process should exceed that of the sublimation at the evaporation pressure range. At optimum room temperature, the root-mean-square (RMS) surface roughness was successfully reduced to 0.2 nm for a 10-nm Ag layer on sapphire substrate with a 1-nm germanium wetting interlayer. Silver layers of 10- and 30-nm thickness were examined using an atomic force microscope (AFM), X-ray reflectometry (XRR), and two-dimensional X-ray diffraction (XRD2).

14 April 2015 in ACS Applied Materials & Interfaces
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Journal Article
Closed access
Piotr WróbelPiotr Wróbel
Piotr Wróbel
TSTomasz Stefaniuk
Tomasz Stefaniuk
MTMarek Trzcinski
Marek Trzcinski
AWAleksandra A. Wronkowska
Aleksandra A. Wronkowska
AWAndrzej Wronkowski
Andrzej Wronkowski
Tomasz SzoplikTomasz Szoplik
Tomasz Szoplik