Lines of research
Deposit of semiconductor films by means of the technique of sputtering and laser ablation, analysis of microwave plasmas and laser ablation by means of Langmuir probes. Determination and analysis of the structure of materials by Raman spectroscopy and Transmission Electron Microscopy (TEM).
Lines of research
Deposit of semiconductor films by means of the technique of sputtering and laser ablation, analysis of microwave plasmas and laser ablation by means of Langmuir probes. Determination and analysis of the structure of materials by Raman spectroscopy and Transmission Electron Microscopy (TEM).