As the increasing demands of compact and space-saving electronics, capacitors with high energy-storage density are eagerly desired. One of the greatest challenges in the development of new high energy density materials is to increase dielectric permittivity. In this present work, we present some first results relative to phosphate glasses, which could be used as the dielectric energy-storage materials to fabricate high energy density devices. They were prepared by means of rapid quenching method. DTA and X-ray diffraction analysis were used to control their vitreous states. Dielectric constant of the glasses was measured at the frequency from 1Hz to 1MHz under the testing temperature from 120K to 360K. The results indicated that some samples exhibit high dielectric properties