Pu Yuan, Ph.D. is a plant biologist specializing in crop stress resistance and molecular mechanisms of plant–pathogen interactions. He earned his Ph.D. in Plant Pathology, with formal training in plant immunity, transcriptomics, metabolomics, and functional genomics. He is currently a Postdoctoral Scholar, transitioning to advanced research in plant epigenetics to explore chromatin-based regulation of gene expression in crops. Dr. Yuan’s research focuses on uncovering how pathogens exploit host metabolic and transcriptional pathways and how plants activate resistance mechanisms. He has authored and co-authored multiple peer-reviewed publications in internationally recognized journals, including Science Advances, New Phytologist, Plant Journal, Biology, and Plants. His work on wheat stripe rust resistance genes (e.g., TaASMT3, TaAP2-15) and beneficial microbes (Bacillus spp.) has contributed important insights into sustainable disease management and crop improvement. He is a co-inventor on a Chinese patent related to wheat disease resistance and has participated in several federally funded research projects. Dr. Yuan is an active member of professional plant science and plant pathology communities and has received recognition for his research productivity and interdisciplinary contributions.