Steve DenBaars

Prof. Steve DenBaars

University of California
orcid

Research Focus & Metrics

Academic Career Length

41Years (1986-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 April 2009 in Nature Photonics
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Journal Article
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SPSiddha Pimputkar
Siddha Pimputkar
JSJames S. Speck
James S. Speck
Steve DenBaarsSteve DenBaars
Steve DenBaars
SNShuji Nakamura
Shuji Nakamura

6 December 1993 in Applied Physics Letters
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Journal Article
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DLD. Leonard
D. Leonard
MKM. Krishnamurthy
M. Krishnamurthy
CRC. M. Reaves
C. M. Reaves
Steve DenBaarsSteve DenBaars
Steve DenBaars
PPP. M. Petroff
P. M. Petroff
The 2D–3D growth mode transition during the initial stages of growth of highly strained InGaAs on GaAs is used to obtain quantum‐sized dot structures. Transmission electron micrographs reveal that when the growth of In0.5Ga0.5As is interrupted exactly at the onset of this 2D–3D transition, dislocation‐free islands (dots) of the InGaAs result. Size distributions indicate that these dots are ∼300 Å in diameter and remarkably uniform to within 10% of this average size. The areal dot densities can be varied between 109 and 1011 cm−2. The uniformity of the dot sizes is explained by a mechanism based on reduction in adatom attachment probabilities due to strain. We unambiguously demonstrate photoluminescence at ∼1.2 eV from these islands by comparing samples with and without dots. The luminescent intensities of the dots are greater than or equal to those of the underlying reference quantum wells.

9 February 2004 in Applied Physics Letters
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Journal Article
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TFT. Fujii
T. Fujii
YGY. Gao
Y. Gao
RSR. Sharma
R. Sharma
EHE. L. Hu
E. L. Hu
Steve DenBaarsSteve DenBaars
Steve DenBaars
SNS. Nakamura
S. Nakamura
Roughened surfaces of light-emitting diodes (LEDs) provide substantial improvement in light extraction efficiency. By using the laser-lift-off technique followed by an anisotropic etching process to roughen the surface, an n-side-up GaN-based LED with a hexagonal “conelike” surface has been fabricated. The enhancement of the LED output power depends on the surface conditions. The output power of an optimally roughened surface LED shows a twofold to threefold increase compared to that of an LED before surface roughening.

30 June 2000 in Applied Physics Letters
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JIJ. P. Ibbetson
J. P. Ibbetson
PFP. T. Fini
P. T. Fini
KNK. D. Ness
K. D. Ness
Steve DenBaarsSteve DenBaars
Steve DenBaars
JSJ. S. Speck
J. S. Speck
UMU. K. Mishra
U. K. Mishra
The origin of the two-dimensional electron gas (2DEG) in AlGaN/GaN heterostructure field effect transistors is examined theoretically and experimentally. Based on an analysis of the electrostatics, surface states are identified as an important source of electrons. The role of the polarization-induced dipole is also clarified. Experimental Hall data for nominally undoped Al0.34Ga0.66N/GaN structures indicate that ∼1.65 eV surface donors are the actual source of the electrons in the 2DEG, which forms only when the barrier thickness exceeds 35 Å.

29 January 1996 in Applied Physics Letters
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BHB. Heying
B. Heying
XWX. H. Wu
X. H. Wu
SKS. Keller
S. Keller
YLY. Li
Y. Li
DKD. Kapolnek
D. Kapolnek
JSJ. S. Speck
J. S. Speck
In this letter we demonstrate that the anomalously low (002) x‐ray rocking curve widths for epitaxial hexagonal GaN films on (001) sapphire are a result of a specific threading dislocation (TD) geometry. Epitaxial GaN films were grown on c‐plane sapphire by atmospheric pressure metalorganic chemical vapor deposition (MOCVD) in a horizontal flow reactor. Films were grown with (002) rocking curves (ω‐scans) widths as low as 40 arcsec and threading dislocation densities of ∼2×1010 cm−2. The threading dislocations in this film lie parallel to the [001] direction and within the limit of imaging statistics, all are pure edge with Burgers vectors parallel to the film/substrate interface. These TDs will not distort the (002) planes. However, distortion of asymmetric planes, such as (102), is predicted and confirmed in (102) rocking curve widths of 740 arcsec. These results are compared with films with (002) rocking curves of ∼270 arcsec and threading dislocation densities of ∼7×108 cm−2.

3 November 1997 in Applied Physics Letters
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Journal Article
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JMJ. F. Muth
J. F. Muth
JLJ. H. Lee
J. H. Lee
ISI. K. Shmagin
I. K. Shmagin
RKR. M. Kolbas
R. M. Kolbas
HCH. C. Casey
H. C. Casey
Steve DenBaarsSteve DenBaars
Steve DenBaars
The absorption coefficient for a 0.4-μm-thick GaN layer grown on a polished sapphire substrate was determined from transmission measurements at room temperature. A strong, well defined exciton peak for the A and B excitons was obtained. The A , B , and C excitonic features are clearly defined at 77 K. At room temperature, an energy gap Eg=3.452±0.001 eV and an exciton binding energy ExA,B=20.4±0.5 meV for the A and B excitons and ExC=23.5±0.5 meV for the C exciton were determined by analysis of the absorption coefficient. From this measured absorption coefficient, together with the detailed balance approach of van Roosbroek and Shockley, the radiative constant B=1.1×10−8 cm3/s was obtained.