Ensuring the availability and reliability of electronic components or materials during operation necessitates conducting a sampling inspection of their lifespan. This is particularly crucial when comparing equipment or materials deployed in various areas with diverse environments, conditions, and situations. Many studies rely on one-method parameter estimation methods, which fall short in identifying the two explicit parameters of the Weibull distribution. Moreover, inaccurate parameter estimation methods impede the attainment of reliable analysis results. Consequently, this paper introduces three analytical estimation methods to determine the parameters of the Weibull distribution. The accuracy of these methods is evaluated using the mean square error (MSE). Furthermore, we utlized the Kolmogorov–Smirnov and Anderson–Darling test on real datasets, confirming that the data follow a Weibull distribution. Simulation results indicate that the maximum likelihood estimate outperforms the other estimators by minimizing the MSE and yielding optimal parameters. These optimal parameters were then applied to real CCTV datasets, demonstrating a good fit and enabling assessment of CCTV lifespan through the mean time to failure, which is estimated to be 6.6 years. This holds true even when the equipment operates in environments with different conditions and situations.