Performance benchmarks have been used over the years to compare different systems. These benchmarks can be useful for researchers trying to determine how changes to the technology, architecture, or compiler affect the system's performance. No such standard exists for systems deployed into high radiation environments, making it difficult to assess whether changes in the fabrication process, circuitry, architecture, or software affect reliability or radiation sensitivity. In this paper, we propose a benchmark suite for high-reliability systems that is designed for field-programmable gate arrays and microprocessors. We describe the development process and report neutron test data for the hardware and software benchmarks.

In this paper, we present the design, implementation and results of a set of IP cores that perform on-board hyperspectral image compression according to the CCSDS 123.0-B-1 lossless standard, specifically designed to be suited for on-board systems and for any kind of hyperspectral sensor. As entropy coder, the sample-adaptive entropy coder defined in the 123.0-B-1 standard or the low-complexity block-adaptive encoder defined by the CCSDS 121.0-B-2 lossless standard could be used. Both IPs, 123.0-B-1 and 121.0-B-2, are part of SHyLoC 2.0, and can be used together for compression of hyperspectral images, being also possible the compression of any kind of data using only the 121-IP. SHyLoC 2.0 improves and extends the capabilities of SHyLoC 1.0, currently available at the ESA IP Cores library, increasing its compression efficiency and throughput, without compromising the resources footprint. Moreover, it incorporates new features, such as the unit-delay predictor option defined by the CCSDS 121.0-B-2 standard, and burst capabilities in the external memory interface of the CCSDS 123-IP, among others. Dedicated architectures have been designed for all the possible input image sample arrangements, in order to maximise throughput and reduce the hardware resources utilization. The design is technology-agnostic, enabling the mapping of the VHDL code in different FPGAs or ASICs. Results are presented for a representative group of well-known space-qualified FPGAs, including the new NanoXplore BRAVE family. A maximum throughput of 150 MSamples/s is obtained for Xilinx Virtex XQR5VFX130 when the SHyLoC 2.0 CCSDS-123 IP is configured in Band-Interleaved by Pixel (BIP) order, using only the 4% of LUTs and less than the 1% of internal memory.

Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware redundancy solutions, such as triple modular redundancy (TMR), produce very high area overhead, so partial redundancy is often used to reduce the overheads. Approximate logic circuits provide a general framework for optimized mitigation of errors arising from a broad class of failure mechanisms, including transient, intermittent, and permanent failures. However, generating an optimal redundant logic circuit that is able to mask the faults with the highest probability while minimizing the area overheads is a challenging problem. In this study, we propose and compare two new approaches to generate approximate logic circuits to be used in a TMR schema. The probabilistic approach approximates a circuit in a greedy manner based on a probabilistic estimation of the error. The evolutionary approach can provide radically different solutions that are hard to reach by other methods. By combining these two approaches, the solution space can be explored in depth. Experimental results demonstrate that the evolutionary approach can produce better solutions, but the probabilistic approach is close. On the other hand, these approaches provide much better scalability than other existing partial redundancy techniques.

TMR is a very effective technique to mitigate SEU effects in FPGAs, but it is often expensive in terms of FPGA resource utilization and power consumption. For certain applications, Partial TMR can be used to trade off the reliability with the cost of mitigation. In this work we propose a new approach to build Partial TMR circuits for FPGAs using approximate logic circuits. This approach is scalable, with a fine granularity, and can provide a flexible balance between reliability and overheads. The proposed approach has been validated by the results of fault injection experiments and proton irradiation campaigns.

Logic masking approaches for Single-Event Transient (SET) mitigation use hardware redundancy to mask the propagation of SET effects. Conventional techniques, such as Triple-Modular Redundancy (TMR), can guarantee full fault coverage, but they also introduce very large overheads. Alternatively, approximate logic circuits can provide the necessary flexibility to find an optimal balance between error coverage and overheads. In this work, we propose a new approach to build approximate logic circuits driven by testability estimations. Using the concept of unate functions, approximations are performed in lines with low testability in order to minimize the impact on error coverage. The proposed approach is scalable and can provide a variety of solutions for different trade-offs between error coverage and overheads.

The use of approximate logic circuits in error mitigation techniques has appeared in the recent years as a way of achieving a sufficient fault coverage at a reduced cost, substituting the exact replicas of the target circuit with simplified versions of it. This approach, when applied to the well-known TMR scheme, results in the Approximate TMR (ATMR) technique, where the target circuit is voted along with two approximate circuits for selective error masking. Such approximate circuits should ideally present an optimal trade-off between costs and error mitigation capabilities, which can be achieved through different approximation generation approaches. This idea be- comes specially promising in FPGA applications because of the flexibility that such devices offer. Depending on the availability of resources and the reliability requirements, the most convenient ATMR configuration can be chosen. However, the particularities of the FPGA architecture must be taken into account in order to generate efficient approximations. This paper reviews some concepts of the ATMR and gives some ideas on its application to FPGA designs. In particular, the use of testability measures to conduct the generation of approximate logic circuits is proposed in this work. The proposed approach has a wide scalability and has been validated by using fault injection, showing that ATMR- hardened designs in FPGAs can be intrinsically more robust than full TMR.