Arif Rasim

Mr. Arif Rasim


Research Focus & Metrics

Academic Career Length

2Years (2025-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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19 July 2025 in Electronics
Verified
Journal Article
Open access
PDF file
LFLukas Fuchs
Lukas Fuchs
MDMarc Diesse
Marc Diesse
MWMatthias Weber
Matthias Weber
ARArif Rasim
Arif Rasim
JFJulian Feinauer
Julian Feinauer
VSVolker Schmidt
Volker Schmidt
The efficient and reliable maintenance and repair of industrial machinery depend critically on circuit diagrams, which serve as essential references for troubleshooting and must be updated when machinery is modified. However, many circuit diagrams are not available in structured, machine-readable format; instead, they often exist as unstructured PDF files, rendered images, or even photographs. Existing digitization methods often address isolated tasks, such as symbol detection, but fail to provide a comprehensive solution. This paper presents a novel pipeline for extracting the underlying graph structures of circuit diagrams, integrating image preprocessing, pattern matching, and graph extraction. A U-net model is employed for noise removal, followed by gray-box pattern matching for device classification, line detection by morphological operations, and a final graph extraction step to reconstruct circuit connectivity. A detailed error analysis highlights the strengths and limitations of each pipeline component. On a skewed test diagram from a scan with slight rotation, the proposed pipeline achieved a device detection accuracy of 88.46% with no false positives and a line detection accuracy of 94.7%.