Felix Börrnert

Felix Börrnert

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Felix Börrnert

Materialwissenschaftliche Elektronenmikroskopie, Universität Ulm, Ulm, Germany

Research Focus & Metrics

Academic Career Length

25Years (2002-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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3 October 2002 in Physical Review B
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ELE. V. Lavrov
E. V. Lavrov
JWJ. Weber
J. Weber
FBF. Börrnert
F. Börrnert
CWChris G. Van de Walle
Chris G. Van de Walle
RHR. Helbig
R. Helbig
Two hydrogen-related defects in ZnO are identified by a combination of local vibrational mode spectroscopy and first-principles theory. The H-I center consists of one hydrogen atom at the bond-center site oriented along the c axis of the crystal. The H-II center contains two inequivalent hydrogen atoms primarily bound to oxygen atoms. The polarized absorption data allow us to identify H-II as a zinc vacancy having two hydrogen atoms.

29 June 2010 in ACS Nano
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Journal Article
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MRMark Rummeli
Mark Rummeli
ABAlicja Bachmatiuk
Alicja Bachmatiuk
ASAndrew Scott
Andrew Scott
FBFelix Börrnert
Felix Börrnert
JWJamie H. Warner
Jamie H. Warner
BBBernd Büchner
Bernd Büchner

26 November 2018 in Nature
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MKMatthias Kühne
Matthias Kühne
FBFelix Börrnert
Felix Börrnert
SFSven Fecher
Sven Fecher
MGMahdi Ghorbani-Asl
Mahdi Ghorbani-Asl
JBJohannes Biskupek
Johannes Biskupek
JSJurgen H. Smet
Jurgen H. Smet

16 August 2011 in Advanced Materials
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MRMark Rummeli
Mark Rummeli
CRClaudia G. Rocha
Claudia G. Rocha
FOFrank Ortmann
Frank Ortmann
IIImad Ibrahim
Imad Ibrahim
HSHaldun Sevincli
Haldun Sevincli
Gianaurelio CunibertiGianaurelio Cuniberti
Gianaurelio Cuniberti

9 August 2016 in Physical Review Letters
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MLMartin Linck
Martin Linck
PHPeter Hartel
Peter Hartel
SUStephan Uhlemann
Stephan Uhlemann
FKFrank Kahl
Frank Kahl
HMHeiko Müller
Heiko Müller
UKUte Kaiser
Ute Kaiser
Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, the chromatic aberration deteriorates the resolution of the TEM image dramatically. Within the framework of the SALVE project, we introduce a newly developed Cc/Cs corrector that is capable of correcting both the chromatic and the spherical aberration in the range of accelerating voltages from 20 to 80 kV. The corrector allows correcting axial aberrations up to fifth order as well as the dominating off-axial aberrations. Over the entire voltage range, optimum phase-contrast imaging conditions for weak signals from light atoms can be adjusted for an optical aperture of at least 55 mrad. The information transfer within this aperture is no longer limited by chromatic aberrations. We demonstrate the performance of the microscope using the examples of 30 kV phase-contrast TEM images of graphene and molybdenum disulfide, showing unprecedented contrast and resolution that matches image calculations.

14 March 2012 in Nano Letters
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ABA. Barreiro
A. Barreiro
FBF. Börrnert
F. Börrnert
MRMark Rummeli
Mark Rummeli
BBB. Büchner
B. Büchner
LVL. M. K. Vandersypen
L. M. K. Vandersypen