22 May 2023 in IEEE Transactions on Neural Networks and Learning Systems
Despite several advances in recent years, learning causal structures represented by directed acyclic graphs (DAGs) remains a challenging task in high-dimensional settings when the graphs to be learned are not sparse. In this article, we propose to exploit a low-rank assumption regarding the (weighted) adjacency matrix of a DAG causal model to help address this problem. We utilize existing low-rank techniques to adapt causal structure learning methods to take advantage of this assumption and establish several useful results relating interpretable graphical conditions to the low-rank assumption. Specifically, we show that the maximum rank is highly related to hubs, suggesting that scale-free (SF) networks, which are frequently encountered in practice, tend to be low rank. Our experiments demonstrate the utility of the low-rank adaptations for a variety of data models, especially with relatively large and dense graphs. Moreover, with a validation procedure, the adaptations maintain a superior or comparable performance even when graphs are not restricted to be low rank.
12 February 2021 in IEEE Transactions on Information Theory
We characterize the asymptotic performance of nonparametric one- and two-sample testing. The exponential decay rate or error exponent of the type-II error probability is used as the asymptotic performance metric, and an optimal test achieves the maximum rate subject to a constant level constraint on the type-I error probability. With Sanov's theorem, we derive a sufficient condition for one-sample tests to achieve the optimal error exponent in the universal setting, i.e., for any distribution defining the alternative hypothesis. We then show that two classes of Maximum Mean Discrepancy (MMD) based tests attain the optimal type-II error exponent on \mathbb R d , while the quadratic-time Kernel Stein Discrepancy (KSD) based tests achieve this optimality with an asymptotic level constraint. For general two-sample testing, however, Sanov's theorem is insufficient to obtain a similar sufficient condition. We proceed to establish an extended version of Sanov's theorem and derive an exact error exponent for the quadratic-time MMD based two-sample tests. The obtained error exponent is further shown to be optimal among all two-sample tests satisfying a given level constraint. Our work hence provides an achievability result for optimal nonparametric one- and two-sample testing in the universal setting. Application to off-line change detection and related issues are also discussed.
21 November 2023 in IEEE Transactions on Cybernetics
Existing multiagent exploration works focus on how to explore in the fully cooperative task, which is insufficient in the environment with nonstationarity induced by agent interactions. To tackle this issue, we propose When to Explore (WToE), a simple yet effective variational exploration method to learn WToE under nonstationary environments. WToE employs an interaction-oriented adaptive exploration mechanism to adapt to environmental changes. We first propose a novel graphical model that uses a latent random variable to model the step-level environmental change resulting from interaction effects. Leveraging this graphical model, we employ the supervised variational auto-encoder (VAE) framework to derive a short-term inferred policy from historical trajectories to deal with the nonstationarity. Finally, agents engage in exploration when the short-term inferred policy diverges from the current actor policy. The proposed approach theoretically guarantees the convergence of the $Q$ -value function. In our experiments, we validate our exploration mechanism in grid examples, multiagent particle environments and the battle game of MAgent environments. The results demonstrate the superiority of WToE over multiple baselines and existing exploration methods, such as MAEXQ, NoisyNets, EITI, and PR2.
19 July 2022 in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The decrease of feature size and the growing complexity of the fabrication process lead to more failures in manufacturing semiconductor devices. Therefore, identifying the root cause layout patterns of failures becomes increasingly crucial for yield improvement. In this paper, a novel layoutaware diagnosis-based layout pattern analysis framework is proposed to identify the root cause efficiently. At the first stage of the framework, an encoder network trained using contrastive learning is used to extract representations of layout snippets that are invariant to trivial transformations including shift, rotation, and mirroring, which are then clustered to form layout patterns. At the second stage, we model the causal relationship between any potential root cause layout patterns and the systematic defects by a structural causal model, which is then used to estimate the Average Causal Effect (ACE) of candidate layout patterns on the systematic defect to identify the true root cause. Experimental results on real industrial cases demonstrate that our framework outperforms a commercial tool with higher accuracies and around ×8.4 speedup on average.