Shaowei Fu

Dr. Shaowei Fu

Advanced Remanufacturing and Technology Centre (Agency for Science, Technology and Research)
+1
orcid

Research Focus & Metrics

Academic Career Length

10Years (2017-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications
13 August 2018 in Sensors
Verified
Journal Article
Open access
PDF file
SFShaowei Fu
Shaowei Fu
Fang ChengFang Cheng
Fang Cheng
TTTegoeh Tjahjowidodo
Tegoeh Tjahjowidodo
YZYu Zhou
Yu Zhou
DBDavid Butler
David Butler
The characterization of surface topographic features on a component is typically quantified using two-dimensional roughness descriptors which are captured by off-line desktop instruments. Ideally any measurement system should be integrated into the manufacturing process to provide in-situ measurement and real-time feedback. A non-contact in-situ surface topography measuring system is proposed in this paper. The proposed system utilizes a laser confocal sensor in both lateral and vertical scanning modes to measure the height of the target features. The roughness parameters are calculated in the developed data processing software according to ISO 4287. To reduce the inherent disadvantage of confocal microscopy, e.g., scattering noise at steep angles and background noise from specular reflection from the optical elements, the developed system has been calibrated and a linear correction factor has been applied in this study. A particular challenge identified for this work is the in-situ measurement of features generated by a robotized surface finishing system. The proposed system was integrated onto a robotic arm with the measuring distance and angle adjusted during measurement based on a CAD model of the component in question. Experimental data confirms the capability of this system to measure the surface roughness within the Ra range of 0.2–7 μm (bandwidth λc/λs of 300), with a relative accuracy of 5%.

15 September 2020 in Procedia CIRP
Verified
Journal Article
Open access
SFShaowei Fu
Shaowei Fu
WKWei Sheng Kor
Wei Sheng Kor
FCFang Cheng
Fang Cheng
LSLeong Keey Seah
Leong Keey Seah
Surface roughness is an important characteristic which affects the quality, performance and lifetime of many types of industrial products, ranging from mechanical and biomedical parts to semiconductors and optics. In recent years, in-situ measurement for surface roughness is increasingly demanded to provide real-time feedback and reduce systematic errors of realignment and repositioning during manufacturing. Commercially available instruments, such as stylus profilometer, confocal laser scanning microscope and coherence scanning interferometer, are limited to a relatively low measurement speed and difficult for in-situ measurement. In this paper, an in-house developed surface measuring system using chromatic confocal sensor was integrated into a mass finishing cell to perform in-situ and non-contact surface roughness measurement. The surface roughness parameters are calculated and evaluated according to ISO 4287 and ISO 4288. From the preliminary experiments, it was verified that the relative error of surface roughness measurements can be kept within 5%.

15 November 2019 in Sensors
Verified
Journal Article
Open access
PDF file
SFShaowei Fu
Shaowei Fu
Fang ChengFang Cheng
Fang Cheng
TTTegoeh Tjahjowidodo
Tegoeh Tjahjowidodo
MLMengjun Liu
Mengjun Liu
In this research paper, a precision position-measurement system based on the image grating technique is presented. The system offers a better robustness and flexibility for 1D position measurement compared to a conventional optical encoder. It is equipped with an image grating attached to a linear stage as the target feature and a line scan camera as the stationary displacement reader. By measuring the position of the specific feature in the image and applying a subpixel image registration method, the position of the linear stage can be obtained. In order to improve the computational efficiency, the calculations for pattern correlation and subpixel registration are performed in the frequency domain. An error compensation method based on a lens distortion model is investigated and implemented to improve the measurement accuracy of the proposed system. Experimental data confirms the capability of the developed image grating system as ±0.3 µm measurement accuracy within a 50 mm range and ±0.2 µm measurement accuracy within a 25 mm range. By applying different optics, the standoff distance, measurement range, and resolution can be customized to conform to different precision measurement applications.

1 January 2020 in Metals
Verified
Journal Article
Open access
PDF file
SFShaowei Fu
Shaowei Fu
Fang ChengFang Cheng
Fang Cheng
TTTegoeh Tjahjowidodo
Tegoeh Tjahjowidodo
Mirror-finished surface products have a wide range of applications in different engineering industries, such as power generation, aerospace, semiconductors and optics. The surface topography of mirror-finished products is typically measured in a metrology laboratory, which is typically time consuming and cannot be integrated into the manufacturing process. To allow for in-situ product quality assurance and automatic tool change for manufacturing processes, a more accurate and responsive surface-measurement method is needed. For highly polished surfaces, a sub-micron surface fluctuation makes it possible to use light-scattering effects and image processing for surface texture analysis. A non-contact surface inspection system using a fringe-patterned illumination method is proposed in this paper. A predesigned pattern was projected onto the target surface, and its reflected image was captured by a camera. It was found that the surface parameters Sa and Sq, which are widely used to evaluate surface quality, are significantly correlated with luminous-intensity distribution. Another parameter, Str, which quantifies the uniformity of surface-texture directions due to polishing or grinding marks, was traditionally quantified after a complete-surface topographic measurement. In this research, a new approach is proposed to determine surface isotropy through a luminance-intensity distribution analysis. By rotating the test coupon, the variation of specular reflection showed correlation with the significance of surface-texture direction. The experimental results demonstrate that mirror-finished surfaces with a large deviation in luminance intensity across the pattern possess low Str values, which indicates low uniformity in surface texture.

26 November 2020 in Applied Sciences
Verified
Journal Article
Open access
PDF file
FCFang Cheng
Fang Cheng
SFShaowei Fu
Shaowei Fu
ZCZiran Chen
Ziran Chen
In this paper, a surface measurement method based on dual-scan positioning strategy is presented to address the challenges of irregular surface patterns and complex geometries. A confocal sensor with an internal scanning mechanism was used in this study. By synchronizing the local scan, enabled by the internal actuator in the confocal sensor, and the global scans, enabled by external positioners, the developed system was able to perform noncontact line scan and area scan. Thus, this system was able to measure both surface roughness and surface uniformity. Unlike laboratory surface measurement equipment, the proposed system is reconfigurable for in situ measurement and able to scan free-form surfaces with a proper stand-off distance and approaching angle. For long-travel line scan, which is needed for rough surfaces, a surface form tracing algorithm was developed to ensure that the data were always captured within the sensing range of the confocal sensor. It was experimentally verified that in a scanning length of 100 mm, where the surface fluctuation in vertical direction is around 10 mm, the system was able to perform accurate surface measurement. For area scan, XY coordinates provided by the lateral positioning system and the Z coordinate captured by the confocal sensor were plotted into one coordinate system for 3D reconstruction. A coherence scanning interferometer and a confocal microscope were employed as the reference measurement systems to verify the performance of the proposed system in a scanning area of 1 mm by 1 mm. Experimental data showed that the proposed system was able to achieve comparable accuracy with laboratory systems. The measurement deviation was within 0.1 µm. Because line scan mechanisms are widely used in sensor design, the presented work can be generalized to expand the applications of line scan sensors.