JACOPO IANNACCI was born in Bologna, Italy, in 1977. He received the MSc (Laurea) degree in electronics engineering and the PhD in information and telecommunications technology from the University of Bologna, Italy, in 2003 and 2007, respectively. He received the Habilitation as a Full Professor in Electronics from the Italian Ministry of University and Research (MUR), in 2021. He worked in 2005 and 2006 as a visiting researcher at the DIMES Technology Center (currently Else Kooi Lab) of the Technical University of Delft, the Netherlands. In 2016, he visited as a second researcher the Fraunhofer Institute for Reliability and Microintegration IZM in Berlin, Germany. Since 2007, he has been a senior researcher (permanent staff) at the Center for Sensors and Devices of Fondazione Bruno Kessler, in Trento, Italy. His research interests and experience fall in the areas of modeling, design, integration, packaging, and testing for the reliability of MEMS and RF-MEMS devices and networks for sensors and actuators, Energy Harvesting (EH-MEMS), and telecommunication systems. Dr. Iannacci authored more than 140 scientific contributions, including international journal papers, conference proceedings, books, book chapters, and one patent.