I earned my Ph.D. in analytical chemistry under the mentorship of Dr. Emily A. Smith at Iowa State University, where I focused on the applications of optical spectroscopy, advanced data analysis, and machine learning techniques in material studies across diverse fields. Currently, I am a metrology engineer at Lam Research, applying optical spectroscopy and modeling techniques in semiconductor film development. My expertise includes optical spectroscopy, material science, nanochemistry, sensors, chemometrics, and machine learning.
Lam Research (United States)
Fremont, California, USA
Metrology