Design space exploration (DSE) of complex embedded systems that combine a number of CPUs, dedicated hardware and software is a tedious task for which a broad range of approaches exists, from the use of high-level models to hardware prototyping. Each of these entails different simulation speed/accuracy tradeoffs, and thereby enables exploring a certain subset of the design space in a given time. Some simulation frameworks devoted to CPU-centric systems have been developed over the past decade, that either feature near real-time simulation speed or moderate to high speed with quasi-cycle level accuracy, often by means of instruction-set simulators or binary translation techniques. This paper presents an evaluation in term of accuracy in modeling real systems using the GEM5 simulator that belong to the first class. Performance figures of a wide range of benchmarks (e.g. in domains such as scientific computing and media applications) are captured and compared to results obtained on real hardware.
17 April 2019 in IEEE Transactions on Circuits and Systems I: Regular Papers
Virtual platform frameworks have been extended to allow earlier soft error analysis of more realistic multicore systems (i.e., real software stacks and state-of-the-art ISAs). The high observability and simulation performance of underlying frameworks enable to generate and collect more error/failure-related data, considering complex software stack configurations, in a reasonable time. When dealing with sizeable failure-related data sets obtained from multiple fault campaigns, it is essential to filter out parameters (i.e., features) without a direct relationship with the system soft error analysis. In this regard, this paper proposes the use of supervised and unsupervised machine learning techniques, aiming to eliminate non-relevant information as well as identify the correlation between fault injection results and application and platform characteristics. This novel approach provides engineers with appropriate means to investigate new and more efficient fault mitigation techniques. The underlying approach is validated with an extensive data set gathered from more than 1.2 million fault injections, comprising several benchmarks, a Linux OS and parallelization libraries (e.g., MPI and OpenMP), as well as through a realistic automotive case study.
Increasing chip power densities allied to the continuous technology shrink is making emerging multiprocessor embedded systems more vulnerable to soft errors. Due the high cost and design time inherent to board-based fault injection approaches, more appropriate and efficient simulation-based fault injection frameworks become crucial to guarantee the adequate design exploration support at early design phase. In this scenario, this paper proposes a fast and flexible fault injector framework, called OVPSim-FIM, which supports parallel simulation to boost up the fault injection process. Aiming at validating OVPSim-FIM, several fault injection campaigns were performed in ARM processors, considering a market leading RTOS and benchmarks with up to 10 billions of object code instructions. Results have shown that OVPSim-FIM enables to inject faults at speed of up to 10,000 MIPS, depending on the processor and the benchmark profile, enabling to identify erros and exceptions according to different criteria and classifications.
26 July 2021 in IEEE Transactions on Circuits and Systems I: Regular Papers
Deep neural networks (DNNs) are being incorporated in resource-constrained IoT devices, which typically rely on reduced memory footprint and low-performance processors. While DNNs' precision and performance can vary and are essential, it is also vital to deploy trained models that provide high reliability at low cost. To achieve an unyielding reliability and safety level, it is imperative to provide electronic computing systems with appropriate mechanisms to tackle soft errors. This paper, therefore, investigates the relationship between soft errors and model accuracy. In this regard, an extensive soft error assessment of the MobileNet model is conducted considering precision bitwidth variations (2, 4, and 8 bits) running on an Arm Cortex-M processor. In addition, this work promotes the use of a register allocation technique (RAT) that allocates the critical DNN function/layer to a pool of specific general-purpose processor registers. Results obtained from more than 4.5 million fault injections show that RAT gives the best relative performance, memory utilization, and soft error reliability trade-offs w.r.t. a more traditional replication-based approach. Results also show that the MobileNet soft error reliability varies depending on the precision bitwidth of its convolutional layers.
The evolution of manycore systems, forecasted to feature hundreds of cores by the end of the decade calls for efficient solutions for design space exploration and debugging. Among the relevant existing solutions the well-known gem5 simulator provides a rich architecture description framework. However, these features come at the price of prohibitive simulation time that limits the scope of possible explorations to configurations made of tens of cores. To address this limitation, this paper proposes a novel trace-driven simulation approach for efficient exploration of manycore architectures.