Krzysztof Mierzejewski

Mr. Krzysztof Mierzejewski

Military University of Technology in Warsaw, Warsaw, Mazowieckie, Poland
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Research Focus & Metrics

Academic Career Length

7Years (2020-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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2 July 2022 in Sensors
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Journal Article
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MKMarcin Kowalski
Marcin Kowalski
AGArtur Grudzień
Artur Grudzień
Krzysztof MierzejewskiKrzysztof Mierzejewski
Krzysztof Mierzejewski
Face recognition operating in visible domains exists in many aspects of our lives, while the remaining parts of the spectrum including near and thermal infrared are not sufficiently explored. Thermal–visible face recognition is a promising biometric modality that combines affordable technology and high imaging qualities in the visible domain with low-light capabilities of thermal infrared. In this work, we present the results of our study in the field of thermal–visible face verification using four different algorithm architectures tested using several publicly available databases. The study covers Siamese, Triplet, and Verification Through Identification methods in various configurations. As a result, we propose a triple triplet face verification method that combines three CNNs being used in each of the triplet branches. The triple triplet method outperforms other reference methods and achieves TAR @FAR 1% values up to 90.61%.

13 June 2025 in Engineering Applications of Artificial Intelligence
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Journal Article
Open access
MKMarcin Kowalski
Marcin Kowalski
Krzysztof MierzejewskiKrzysztof Mierzejewski
Krzysztof Mierzejewski
TPTomasz Pałys
Tomasz Pałys

30 June 2021 in Photonics Letters of Poland
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Journal Article
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MKMarcin Kowalski
Marcin Kowalski
Krzysztof MierzejewskiKrzysztof Mierzejewski
Krzysztof Mierzejewski
Biometric systems are becoming more and more efficient due to increasing performance of algorithms. These systems are also vulnerable to various attacks. Presentation of falsified identity to a biometric sensor is one the most urgent challenges for the recent biometric recognition systems. Exploration of specific properties of thermal infrared seems to be a comprehensive solution for detecting face presentation attacks. This letter presents outcome of our study on detecting 3D face masks using thermal infrared imaging and deep learning techniques. We demonstrate results of a two-step neural network-featured method for detecting presentation attacks. Full Text: PDF ReferencesS.R. Arashloo, J. Kittler, W. Christmas, "Face Spoofing Detection Based on Multiple Descriptor Fusion Using Multiscale Dynamic Binarized Statistical Image Features", IEEE Trans. Inf. Forensics Secur. 10, 11 (2015). CrossRef A. Anjos, M.M. Chakka, S. Marcel, "Motion-based counter-measures to photo attacks inface recognition", IET Biometrics 3, 3 (2014). CrossRef M. Killioǧlu, M. Taşkiran, N. Kahraman, "Anti-spoofing in face recognition with liveness detection using pupil tracking", Proc. SAMI IEEE, (2017). CrossRef A. Asaduzzaman, A. Mummidi, M.F. Mridha, F.N. Sibai, "Improving facial recognition accuracy by applying liveness monitoring technique", Proc. ICAEE IEEE, (2015). CrossRef M. Kowalski, "A Study on Presentation Attack Detection in Thermal Infrared", Sensors 20, 14 (2020). CrossRef C. Galdi, et al, "PROTECT: Pervasive and useR fOcused biomeTrics bordEr projeCT - a case study", IET Biometrics 9, 6 (2020). CrossRef D.A. Socolinsky, A. Selinger, J. Neuheisel, "Face recognition with visible and thermal infrared imagery", Comput. Vis Image Underst. 91, 1-2 (2003) CrossRef L. Sun, W. Huang, M. Wu, "TIR/VIS Correlation for Liveness Detection in Face Recognition", Proc. CAIP, (2011). CrossRef J. Seo, I. Chung, "Face Liveness Detection Using Thermal Face-CNN with External Knowledge", Symmetry 2019, 11, 3 (2019). CrossRef A. George, Z. Mostaani, D Geissenbuhler, et al., "Biometric Face Presentation Attack Detection With Multi-Channel Convolutional Neural Network", IEEE Trans. Inf. Forensics Secur. 15, (2020). CrossRef S. Ren, K. He, R. Girshick, J. Sun, "Proceedings of IEEE Conference on Computer Vision and Pattern Recognition", Proc. CVPR IEEE 39, (2016). CrossRef K. He, X. Zhang, S. Ren, J. Sun, "Deep Residual Learning for Image Recognition", Proc. CVPR, (2016). CrossRef K. Mierzejewski, M. Mazurek, "A New Framework for Assessing Similarity Measure Impact on Classification Confidence Based on Probabilistic Record Linkage Model", Procedia Manufacturing 44, 245-252 (2020). CrossRef

1 January 2020 in Procedia Manufacturing
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Krzysztof MierzejewskiKrzysztof Mierzejewski
Krzysztof Mierzejewski
MMMarcin Mazurek
Marcin Mazurek