Liao Qingjun received the B.S. degree in microelectronics from Sichuan University, Chengdu, The People's Republic of China, in 1999, and the M.S. degree in optics from Sichuan University, Chengdu, The People's Republic of China, in 2002. She is a researcher of Infrared detectors at Shanghai Institute of Technical Physics Chinese Academy of Sciences, Shanghai, PRC. Her research interest includes infrared detectors’ fabrication process, failure analysis of IR detector and large format HgCdTe infrared focal plane detector.