Xiaolong Si received the M.S. degree in Optical Engineer from the HAWK University of Applied Sciences and Arts Hildesheim/Holzminden/Goettingen Germany in 2010. He is currently an Assistant Researcher with Key Laboratory of Optical Calibration and Characterization, Hefei Institute of Physical Science, Chinese Academy of Sciences . His general research interests include the method of radiometric calibration and optical measurement technology. In these areas, he has published 2 papers。