The existence of a correlation between current collapse and off-state reverse-bias leakage current in heteroepitaxially grown AlGaN/GaN high-electron-mobility transistors is investigated from the perspective of conductive threading dislocations. Collapsed current response (recoverable) to synchronized gate-drain voltage pulses is found to be governed by the epilayer's dislocation density, and also by the off-state quiescent bias scheme. Furthermore, magnitudes of reverse-gate leakages apart from being dislocation density dependent are found to have distinctive temperature-bias characteristics. Based on the trapping spatiality along with field and temperature dependence of the respective leakage currents; an emission mechanism is postulated involving donor-like surface states and dislocation induced deep levels. It is inferred that dislocations can indeed be responsible for the current collapse that has been long assumed to be caused by the surface states.

Highly sensitive acetone sensing performance of Pd/AlGaN/GaN resistive devices in the temperature range of 100 °C-250 °C and in the detection range of 100-1000 ppm was reported. A plasma-assisted molecular beam epitaxy was used to grow the AlGaN/GaN heterostructure on Si (111) substrate. Structural characterization of the grown epilayers was performed through double-crystal X-ray diffraction whereas atomic force microscopy was used to obtain the roughness of the sensing surface. Resistive mode configuration of the sample was tested toward acetone in the detection range of 100-1000 ppm and in the temperature range of 100 °C-250 °C. The optimum temperature was found to be 150 °C with response magnitude ~95% for the acetone concentration of 1000 ppm. The sensor response time and recovery time were found to be in the range of ~18-44 s and ~25-109 s, respectively. The cross-sensitivity of the device with other interfering species such as butanone, benzene, toluene, and xylene attributed to good acetone selectivity of the devices. Acetone sensing as well as current transport of the Pd/AlGaN/GaN devices was illustrated with effect including Langmuir adsorption-desorption kinetics and Schottky barrier height between Pd/AlGaN interfaces.

A new and astonishing resistive gas sensor based on All-IDE/HfS2, synthesized by chemical route, has been developed for precise detection of methanol vapor at room temperature. A high sensitivity of 1.29 has been found at room temperature with the exposure of 500 ppm of methanol vapor at an operating bias of 1 V. Sensitivity has been obtained from transient response analysis. Most importantly, very fast response/recovery characteristics with good baseline restoration have been witnessed. The response time and recovery time have been recorded in the range of ∼12.12 s to ∼21.14 s and ∼23.72 s to ∼39 s. Cross-sensitivity with other interfering species has also been studied. A comprehensive justification, including Langmuir adsorption-desorption isotherm for appreciable sensing response, has also been delineated.