Subiao Bian, Ph.D. is an early-career researcher in applied optics and optical metrology. He received his Ph.D. in Applied Physics from the University of Barcelona and Huaqiao University, where his doctoral research focused on Mueller matrix ellipsometry, polarization imaging, and the optical characterization of anisotropic and complex media. He holds a strong educational background in physics and optical engineering, with formal training in polarization optics, spectroscopic ellipsometry, and advanced optical instrumentation.