Xiaobing Feng

Dr. Xiaobing Feng

orcid

Research Focus & Metrics

Academic Career Length

17Years (2010-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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30 December 2019 in The International Journal of Advanced Manufacturing Technology
Verified
Journal Article
Open access
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IEIfeanyichukwu Echeta
Ifeanyichukwu Echeta
Xiaobing FengXiaobing Feng
Xiaobing Feng
BDBen Dutton
Ben Dutton
RLRichard Leach
Richard Leach
SPSamanta Piano
Samanta Piano
Additively manufactured lattice structures are popular due to their desirable properties, such as high specific stiffness and high surface area, and are being explored for several applications including aerospace components, heat exchangers and biomedical implants. The complexity of lattices challenges the fabrication limits of additive manufacturing processes and thus, lattices are particularly prone to manufacturing defects. This paper presents a review of defects in lattice structures produced by powder bed fusion processes. The review focuses on the effects of lattice design on dimensional inaccuracies, surface texture and porosity. The design constraints on lattice structures are also reviewed, as these can help to discourage defect formation. Appropriate process parameters, post-processing techniques and measurement methods are also discussed. The information presented in this paper contributes towards a deeper understanding of defects in lattice structures, aiming to improve the quality and performance of future designs.

1 November 2020 in International Journal of Machine Tools and Manufacture
Verified
Journal Article
Closed access
MDMing Deng
Ming Deng
HLHuimin Li
Huimin Li
SXSitong Xiang
Sitong Xiang
PLPuling Liu
Puling Liu
Xiaobing FengXiaobing Feng
Xiaobing Feng
JYJianguo Yang
Jianguo Yang

1 May 2020 in Precision Engineering
Verified
Journal Article
Closed access
GGGuangyan Ge
Guangyan Ge
ZDZhengchun Du
Zhengchun Du
Xiaobing FengXiaobing Feng
Xiaobing Feng
JYJianguo Yang
Jianguo Yang

1 October 2019 in Optics and Lasers in Engineering
Verified
Journal Article
Open access
Xiaobing FengXiaobing Feng
Xiaobing Feng
NSNicola Senin
Nicola Senin
RSRong Su
Rong Su
SRSuresh Ramasamy
Suresh Ramasamy
Richard LeachRichard Leach
Richard Leach

4 June 2019 in Measurement Science and Technology
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Journal Article
Open access
PDF file
GMGiacomo Maculotti
Giacomo Maculotti
Xiaobing FengXiaobing Feng
Xiaobing Feng
RSRong Su
Rong Su
MGMauirizio Galetto
Mauirizio Galetto
RLRichard K Leach
Richard K Leach
Point autofocus instruments are often used for measuring the surface topography of objects with complex geometry. Determining the metrological characteristics of the instrument is key to ensuring a traceable areal surface topography measurement. In this work, several metrological characteristics, as outlined in ISO/FDIS 25178-600, are determined for a commercial point autofocus instrument, including flatness deviation, the amplification and linearity of the lateral and vertical axes, and the perpendicularity between the axes. Calibrated material measures including an optical flat, step heights and areal cross gratings are used to determine the metrological characteristics. The impact of the point autofocus operating principle and the evaluation method on the metrological characteristics is discussed.

26 April 2018 in Measurement Science and Technology
Verified
Journal Article
Closed access
PDF file
GMGiacomo Maculotti
Giacomo Maculotti
Xiaobing FengXiaobing Feng
Xiaobing Feng
MGMauirizio Galetto
Mauirizio Galetto
Richard LeachRichard Leach
Richard Leach
In this work, the measurement noise of a point autofocus surface topography measuring instrument is evaluated, as the first step towards establishing a route to traceability for this type of instrument. The evaluation is based on the determination of the metrological characteristics for noise as outlined in draft ISO specification standards by using a calibrated optical flat. The static noise and repeatability of the autofocus sensor are evaluated. The influence of environmental disturbances on the measured surface topography and the built-in software to compensate for such influences are also investigated. The instrument was found to have a measurement noise of approximately 2 nm or, when expressed with the measurement bandwidth, 0.4 nm for a single-point measurement.