Chemical reduction in oxides plays a crucial role in engineering the material properties through structural transformation and electron filling. Controlling the reduction at nanoscale forms a promising pathway to harvest functionalities, which however is of great challenge for conventional methods (e.g., thermal treatment and chemical reaction). Here, we demonstrate a convenient pathway to achieve nanoscale chemical reduction for vanadium dioxide through the electron-beam illumination. The electron beam induces both surface oxygen desorption through radiolytic process and positively charged background through secondary electrons, which contribute cooperatively to facilitate the vacancy migration from the surface toward the sample bulk. Consequently, the VO₂ transforms into a reduced V₂O₃ phase, which is associated with a distinct insulator to metal transition at room temperature. Furthermore, this process shows an interesting facet-dependence with the pronounced transformation observed for the c-facet VO₂ as compared with the a-facet, which is attributed to the intrinsically different oxygen vacancy formation energy between these facets. Remarkably, we readily achieve a lateral resolution of tens nanometer for the controlled structural transformation with a commercial scanning electron microscope. This work provides a feasible strategy to manipulate the nanoscale chemical reduction in complex oxides for exploiting functionalities.

This paper reports a study of time-resolved deformation process at the atomic scale of a nanocrystalline Pt thin film captured in situ under a transmission electron microscope. The main mechanism of plastic deformation was found to evolve from full dislocation activity-enabled plasticity in large grains (with grain size d > 10 nm), to partial dislocation plasticity in smaller grains (with grain size 10 nm < d < 6 nm), and grain boundary-mediated plasticity in the matrix with grain sizes d < 6 nm. The critical grain size for the transition from full dislocation activity to partial dislocation activity was estimated based on consideration of stacking fault energy. For grain boundary-mediated plasticity, the possible contributions to strain rate of grain creep, grain sliding and grain rotation to plastic deformation were estimated using established models. The contribution of grain creep is found to be negligible, the contribution of grain rotation is effective but limited in magnitude, and grain sliding is suggested to be the dominant deformation mechanism in nanocrystalline Pt thin films. This study provided the direct evidence of these deformation processes at the atomic scale.

Electromagnetic phenomena, such as magnetization switching, are guided by parity and time-reversal symmetries. Magnetic field and magnetization are time-odd axial vectors. Therefore, the magnetic field can switch magnetization reversibly. In contrast, the electric field is a time-even polar vector that cannot directly switch magnetization. For magnetic recording, an electrical coil-generated local magnetic field is used to switch the magnetic bit. However, in order to integrate the magnetic functionality, e.g., nonvolatile magnetic memory with high speed and low energy consumption, into the chip, it is essential to implement the magnetization switching by an electrical current, where the current induces other axial vectors through spin-transfer torque or spin–orbit torque (SOT). As an energy-efficient tool of magnetization switching, current-induced SOT has been intensively studied for the past decade, which holds great promise in the next generation of magnetic memories and magnetic logic devices [A. Manchon et al., Rev. Mod. Phys. 91, 035004 (2019); X. Han et al., Appl. Phys. Lett. 118, 120502 (2021); C. Song et al., Prog. Mater. Sci. 118, 100761 (2021); Q. Shao et al., IEEE Trans. Magn. 57, 21076639 (2021); J. Ryu et al., Adv. Mater. 32, 1907148 (2020); Y. Cao et al., iScience 23, 101614 (2020)]. In this review, we will first give the basic principle of the symmetry considerations for current-induced magnetization switching. Then, different methods to break the mirror symmetry for deterministic SOT switching will be discussed, together with examples that contain recent progress. In the end, we will give a discussion on the challenges and perspectives of the symmetry designs for SOT, which aim to inspire future fundamental studies and device applications.

In this study, the deformation mechanisms of bent Si nanowires are investigated at the atomic scale with bending strain up to 12.8%. The sign and magnitude of the applied strain are found to govern their deformation mechanisms, in which the dislocation types (full or partial dislocations) can be affected by the sign (tensile or compressive) and magnitude of the applied strain. In the early stages of bending, plastic deformation is controlled by 60° full dislocations. As the bending increases, Lomer dislocations can be frequently observed. When the strain increases to a significant level, 90° partial dislocations induced from the tensile surfaces of the bent nanowires are observed. This study provides a deeper understanding of the effect of the sign and magnitude of the bending strain on the deformation mechanisms in bent Si nanowires.