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<mml:math display="inline"><mml:mrow><mml:mo>(</mml:mo><mml:mi>CdS</mml:mi><mml:mo>)</mml:mo></mml:mrow></mml:math>(CdS) thin films were deposited in an oscillating chemical bath using a Teflon vane connected to an electrical dental brush oscillating at <mml:math display="inline"><mml:mrow><mml:mn>37</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi>Hz</mml:mi></mml:mrow></mml:math>37Hz . The range of the bath temperature was from 65 to <mml:math display="inline"><mml:mrow><mml:mn>85</mml:mn><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:mrow></mml:math>85°C in intervals of <mml:math display="inline"><mml:mrow><mml:mn>5</mml:mn><mml:mo>°</mml:mo><mml:mi mathvariant="normal">C</mml:mi></mml:mrow></mml:math>5°C and different deposition times. By this agitation technique we obtained <mml:math display="inline"><mml:mrow><mml:mi>CdS</mml:mi></mml:mrow></mml:math>CdS films with a highly oriented hexagonal structure (α-greenockite) in the (002) direction as measured by X-ray diffraction patterns. Images of atomic force microscopy and stoichiometry values obtained by energy-dispersive analysis by X-ray confirm the good quality of deposited films. High stoichiometry on the <mml:math display="inline"><mml:mrow><mml:mi>CdS</mml:mi></mml:mrow></mml:math>CdS films was measured by elemental analysis with variations less than 3.5% in all samples. The mean value of the gap energy was about <mml:math display="inline"><mml:mrow><mml:mn>2.38</mml:mn><mml:mspace width="0.3em"></mml:mspace><mml:mi>eV</mml:mi></mml:mrow></mml:math>2.38eV , a close value for these films.No biography provided yet