John K. Delaney is a senior Imaging Scientist in the Scientific Research Department of the Conservation Division of the National Gallery of Art, Washington. His research focuses on the adaptation of remote sensing sensors and processing methods for studying paintings and works on paper. In addition to his work at the Gallery, Delaney also served as a research professor in the Department of Electrical and Computer Engineering of the School of Engineering and Applied Science at George Washington University from 2011 to 2013. Before joining the Gallery, Delaney was chief scientist for the Advanced Sensors Business Unit of the ISR Airborne Systems Division of the Goodrich Corporation. He received his BS from the Worcester Polytechnic Institute and his PhD from Rockefeller University, and he completed postdoctoral studies at the University of Arizona and the Johns Hopkins University School of Medicine. In 2007, Delaney joined the Gallery (funding provided by the Andrew W. Mellon Foundation). In the years since Delaney and colleagues in the scientific research department have optimized hyperspectral visible and infrared imaging cameras and image processing to better visualize painted-over compositions and map the distribution of pigments, additional funding from the Mellon Foundation, Samuel H. Kress Foundation, and National Science Foundation has supported the ongoing training by Delaney of fellows in new advanced imaging methods.