Prof. Cheng Lei was born in Chang Zhi, China, in 1987. He received an M.S.and Ph.D. in Testing Technologies and Instruments from the North University of China, Taiyuan, China, in 2013 and 2016, respectively. He is currently a senior experimenter in the Department of Instrumentation and Electronics at the North University of China. His research focus is in the fields of extreme environmental testing and MEMS technology.