Stefano Manetti

Prof. Stefano Manetti

University of Florence - Department of Information Engineering (DINFO)
orcid

Research Focus & Metrics

Academic Career Length

47Years (1980-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications

1 January 1991 in IEEE Transactions on Circuits and Systems
Verified
Journal Article
Closed access
Gianfranco AvitabileGianfranco Avitabile
Gianfranco Avitabile
MFM. Forti
M. Forti
Stefano ManettiStefano Manetti
Stefano Manetti
MMM. Marini
M. Marini

1 July 1999 in IEEE Transactions on Circuits and Systems I: Regular Papers
Verified
Journal Article
Closed access
GFG. Fedi
G. Fedi
Stefano ManettiStefano Manetti
Stefano Manetti
MPMaria Cristina Piccirilli
Maria Cristina Piccirilli
JSJanusz Starzyk
Janusz Starzyk
A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambi- guity group concept. New considerations relevant to the existence of unique solution in the -fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed procedure are considered by exploiting a software package based on symbolic analysis techniques.

4 July 2018 in IEEE Transactions on Instrumentation and Measurement
Verified
Journal Article
Closed access
Antonio LuchettaAntonio Luchetta
Antonio Luchetta
Stefano ManettiStefano Manetti
Stefano Manetti
MPMaria Cristina Piccirilli
Maria Cristina Piccirilli
Alberto ReattiAlberto Reatti
Alberto Reatti
Fabio CortiFabio Corti
Fabio Corti
Marian K. KazimierczukMarian K. Kazimierczuk
Marian K. Kazimierczuk
This paper presents an effective approach to the fault diagnosis of pulsewidth modulated (PWM) DC-DC power converters. It is based on a multilayer multivalued neuron neural network with a complex QR decomposition. This network is used to identify the parameter values running out of tolerance range in two topologies of PWM DC-DC converters, namely, the buck and boost circuits. The proposed technique is based on measurements of steady-state voltages and currents waveforms.

6 December 2007 in IEEE Transactions on Instrumentation and Measurement
Verified
Journal Article
Closed access
FGFrancesco Grasso
Francesco Grasso
Antonio LuchettaAntonio Luchetta
Antonio Luchetta
Stefano ManettiStefano Manetti
Stefano Manetti
MPMaria Cristina Piccirilli
Maria Cristina Piccirilli
A new procedure for the selection of test frequencies in the parametric fault diagnosis of analog circuits is presented. It is based on the evaluation of algebraic indices, as the condition number and the norm of the inverse, of a sensitivity matrix of the circuit under test. This matrix is obtained starting from the testability analysis of the circuit. A test index (T.I.) that permits the selection of the set of frequencies that better leads to locating parametric faults in analog circuits is defined. By exploiting symbolic analysis techniques, a program that implements the proposed procedure has been developed. It yields the requested set of frequencies by means of an optimization procedure based on a genetic algorithm that minimizes the T.I. Examples of the application of the proposed procedure are also included.

1 January 1998 in IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Verified
Journal Article
Closed access
GFG. Fedi
G. Fedi
RGR. Giomi
R. Giomi
Antonio LuchettaAntonio Luchetta
Antonio Luchetta
Stefano ManettiStefano Manetti
Stefano Manetti
MPMaria Cristina Piccirilli
Maria Cristina Piccirilli