High-pressure is utilized to realize new 2D layered structures in PdSe₂ with high-mobility transport anisotropy for photovoltaic applications.

The quasi 2D layered-structure PdSe₂is predicted to be an intrinsic ferroelastic material with a stress-driven 90° lattice rotation, which is a promising material for perspective applications in microelectromechanical and nanoelectronic device.

The high-pressure (HP) modification of CePtSn was prepared under multianvil high-pressure (9.2 GPa) high-temperature (1325 K) conditions from the normal-pressure (NP) modification. Both modifications were investigated by powder and single crystal X-ray data: TiNiSi type, Pnma, a = 746.89(9), b = 462.88(4), c = 801.93(7) pm, wR2 = 0.0487, 452 F² values, 20 variable parameters for NP-CePtSn, and ZrNiAl type, P6̅2m, a = 756.919(5), c = 415.166(4) pm, wR2 = 0.0546, 252 F² values, 14 variable parameters for HP-CePtSn. Both modifications are built up from platinumcentered trigonal prisms. Together, the platinum and tin atoms form different three-dimensional [PtSn] networks in which the cerium atoms fill channels. The crystal chemistry and chemical bonding of NP- and HP-CePtSn is discussed. Susceptibility measurements of HP-CePtSn indicate Curie-Weiss behavior above 40 K with an experimental magnetic moment of 2.55(1) μB/Ce atom, indicating trivalent cerium. No magnetic ordering could be detected down to 2 K.

The new compound Ga_2.81O_3.57N_0.43 was crystallized under high-pressure / high-temperature conditions in a spinel-type structure from a prestructured gallium oxonitride ceramic, which was obtained from the single-source molecular precursor [Ga(O^tBu)₂NMe₂]₂ by thermal treatment in an ammonia atmosphere. The optimized precursor-derived gallium oxonitride ceramic remains nanocrystalline up to 600 °C and can be transformed at 7 GPa and 1100 °C into the crystalline phase Ga_2.81O_3.57N_0.43. The structure, homogeneity, and nitrogen to oxygen ratio were determined using TEM coupled with an electron energy loss spectrometer (EELS) and an energy dispersive X-ray (EDX) spectrometer. For phase analysis and structure confirmation, X-ray powder diffraction data were measured.