Tsimafei Laryn

Mr. Tsimafei Laryn


Research Focus & Metrics

Academic Career Length

6Years (2021-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications
6 February 2021 in Materials
Verified
Journal Article
Open access
PDF file
APAlexander A. Poznyak
Alexander A. Poznyak
APAndrei Pligovka
Andrei Pligovka
TLTsimafei Laryn
Tsimafei Laryn
Marco SalernoMarco Salerno
Marco Salerno
The volumetric growth, composition, and morphology of porous alumina films fabricated by reduced temperature 280 K galvanostatic anodizing of aluminum foil in 0.4, 1.0, and 2.0 M aqueous sulfuric acid with 0.5–10 mA·cm−2 current densities were investigated. It appeared that an increase in the solution concentration from 0.4 to 2 M has no significant effect on the anodizing rate, but leads to an increase in the porous alumina film growth. The volumetric growth coefficient increases from 1.26 to 1.67 with increasing current density from 0.5 to 10 mA·cm−2 and decreases with increasing solution concentration from 0.4 to 2.0 M. In addition, in the anodized samples, metallic aluminum phases are identified, and a tendency towards a decrease in the aluminum content with an increase in solution concentration is observed. Anodizing at 0.5 mA·cm−2 in 2.0 M sulfuric acid leads to formation of a non-typical nanostructured porous alumina film, consisting of ordered hemispheres containing radially diverging pores.

20 January 2023 in Energies
Verified
Journal Article
Open access
PDF file
YKYeonhwa Kim
Yeonhwa Kim
MMMay Angelu Madarang
May Angelu Madarang
EJEunkyo Ju
Eunkyo Ju
TLTsimafei Laryn
Tsimafei Laryn
RCRafael Jumar Chu
Rafael Jumar Chu
DJDaehwan Jung
Daehwan Jung
Epitaxial growth of III–V materials on Si is a promising approach for large-scale, relatively low-cost, and high-efficiency Si-based multi-junction solar cells. Several micron-thick III–V compositionally graded buffers are typically grown to reduce the high threading dislocation density that arises due to the lattice mismatch between III–V and Si. Here, we show that optically transparent n-In0.1Al0.9As/n-GaAs strained layer superlattice dislocation filter layers can be used to reduce the threading dislocation density in the GaAs buffer on Si while maintaining the GaAs buffer thickness below 2 μm. Electron channeling contrast imaging measurements on the 2 μm n-GaAs/Si template revealed a threading dislocation density of 6 × 107 cm−2 owing to the effective n-In0.1Al0.9As/n-GaAs superlattice filter layers. Our GaAs/Si tandem cell showed an open-circuit voltage of 1.28 V, Si bottom cell limited short-circuit current of 7.2 mA/cm2, and an efficiency of 7.5%. This result paves the way toward monolithically integrated triple-junction solar cells on Si substrates.