Nonlinear control of topology: Controlling the topological properties of physical systems provides a platform for developing devices and technology that are robust to defects. Xia et al. present a photonic platform in which the underlying dynamics are driven and tuned by the interplay among topology, non-Hermiticity, and nonlinearity (see the Perspective by Roztocki and Morandotti). Using photonic lattices consisting of laser-written waveguides that are continuous (“gain”) and sectioned (“loss”) and coupled to an interface defect, they demonstrate the nonlinear control of parity-time symmetry and nonlinearity-induced restoration and/or destruction of non-Hermitian topological states. Such concepts are applicable to a broad spectrum of non-Hermitian systems that have intensity-dependent gain or loss and may enable new approaches for light manipulation. Science , this issue p. 72 ; see also p. 32

Higher-order topological insulators (HOTIs) are recently discovered topological phases, possessing symmetry-protected corner states with fractional charges. An unexpected connection between these states and the seemingly unrelated phenomenon of bound states in the continuum (BICs) was recently unveiled. When nonlinearity is added to the HOTI system, a number of fundamentally important questions arise. For example, how does nonlinearity couple higher-order topological BICs with the rest of the system, including continuum states? In fact, thus far BICs in nonlinear HOTIs have remained unexplored. Here we unveil the interplay of nonlinearity, higher-order topology, and BICs in a photonic platform. We observe topological corner states that are also BICs in a laser-written second-order topological lattice and further demonstrate their nonlinear coupling with edge (but not bulk) modes under the proper action of both self-focusing and defocusing nonlinearities. Theoretically, we calculate the eigenvalue spectrum and analog of the Zak phase in the nonlinear regime, illustrating that a topological BIC can be actively tuned by nonlinearity in such a photonic HOTI. Our studies are applicable to other nonlinear HOTI systems, with promising applications in emerging topology-driven devices.

Plasmonic metasurfaces have recently attracted much attention because of their novel characteristics with respect to light polarization and wave front control on deep-subwavelength scales. The development of metasurfaces with reconfigurable optical responses is opening new opportunities in high-capacity communications, real-time holograms and adaptive optics. Such tunable devices have been developed in the mid-infrared spectral range and operated in light intensity modulation schemes. Here we present a novel optically reconfigurable hybrid metasurface that enables polarization tuning at optical frequencies. The functionality of tuning is realized by switching the coupling conditions between the plasmonic modes and the binary isomeric states of an ethyl red switching layer upon light stimulation. We achieved more than 20° nonlinear changes in the transmitted polarization azimuth using just 4 mW of switching light power. Such design schemes and principles could be easily applied to dynamically adjust the functionalities of other metasurfaces.

Ellipsometry is a powerful method for determining both the optical constants and thickness of thin films. For decades, solutions to ill-posed inverse ellipsometric problems require substantial human–expert intervention and have become essentially human-in-the-loop trial-and-error processes that are not only tedious and time-consuming but also limit the applicability of ellipsometry. Here, we demonstrate a machine learning based approach for solving ellipsometric problems in an unambiguous and fully automatic manner while showing superior performance. The proposed approach is experimentally validated by using a broad range of films covering categories of metals, semiconductors, and dielectrics. This method is compatible with existing ellipsometers and paves the way for realizing the automatic, rapid, high-throughput optical characterization of films.