Mengxin Ren

Dr. Mengxin Ren


Research Focus & Metrics

Academic Career Length

16Years (2011-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 January 2012 in Nature Communications
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Journal Article
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MRMengxin Ren
Mengxin Ren
EPEric Plum
Eric Plum
JXJingjun Xu
Jingjun Xu
NZNikolay I. Zheludev
Nikolay I. Zheludev

24 October 2011 in Advanced Materials
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MRMengxin Ren
Mengxin Ren
BJBAOHUA JIA
BAOHUA JIA
Jun-Yu OuJun-Yu Ou
Jun-Yu Ou
EPEric Plum
Eric Plum
Jianfa ZhangJianfa Zhang
Jianfa Zhang
NZNikolay I. Zheludev
Nikolay I. Zheludev

16 November 2016 in Light: Science & Applications
Verified
Journal Article
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MRMengxin Ren
Mengxin Ren
WWWei Wu
Wei Wu
WCWei Cai
Wei Cai
BPBiao Pi
Biao Pi
XZXin-Zheng Zhang
Xin-Zheng Zhang
JXJingjun Xu
Jingjun Xu
Plasmonic metasurfaces have recently attracted much attention because of their novel characteristics with respect to light polarization and wave front control on deep-subwavelength scales. The development of metasurfaces with reconfigurable optical responses is opening new opportunities in high-capacity communications, real-time holograms and adaptive optics. Such tunable devices have been developed in the mid-infrared spectral range and operated in light intensity modulation schemes. Here we present a novel optically reconfigurable hybrid metasurface that enables polarization tuning at optical frequencies. The functionality of tuning is realized by switching the coupling conditions between the plasmonic modes and the binary isomeric states of an ethyl red switching layer upon light stimulation. We achieved more than 20° nonlinear changes in the transmitted polarization azimuth using just 4 mW of switching light power. Such design schemes and principles could be easily applied to dynamically adjust the functionalities of other metasurfaces.

18 March 2021 in Laser & Photonics Reviews
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JMJunjun Ma
Junjun Ma
FXFei Xie
Fei Xie
WCWeijin Chen
Weijin Chen
JCJiaxin Chen
Jiaxin Chen
WWWei Wu
Wei Wu
JXJingjun Xu
Jingjun Xu

12 March 2021 in Light: Science & Applications
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JLJinchao Liu
Jinchao Liu
DZDi Zhang
Di Zhang
DYDianqiang Yu
Dianqiang Yu
MRMengxin Ren
Mengxin Ren
JXJingjun Xu
Jingjun Xu
Ellipsometry is a powerful method for determining both the optical constants and thickness of thin films. For decades, solutions to ill-posed inverse ellipsometric problems require substantial human–expert intervention and have become essentially human-in-the-loop trial-and-error processes that are not only tedious and time-consuming but also limit the applicability of ellipsometry. Here, we demonstrate a machine learning based approach for solving ellipsometric problems in an unambiguous and fully automatic manner while showing superior performance. The proposed approach is experimentally validated by using a broad range of films covering categories of metals, semiconductors, and dielectrics. This method is compatible with existing ellipsometers and paves the way for realizing the automatic, rapid, high-throughput optical characterization of films.

29 November 2022 in Nano Letters
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Journal Article
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LQLun Qu
Lun Qu
LBLu Bai
Lu Bai
CJChunyan Jin
Chunyan Jin
QLQiang Liu
Qiang Liu
WWWei Wu
Wei Wu
JXJingjun Xu
Jingjun Xu