We present an effective approach using a matched pair of polymer-based condenser–objective lenses to build a compact full-field x-ray microscope with a high spatial resolution. A unique condenser comprising arrays of high-aspect-ratio prisms with equilateral cross section is used for uniformly illuminating samples over a large field of view (FOV) from all angles, which match the acceptance of an objective made of interdigitated orthogonal rows of one-dimensional lenses. State-of-the-art Talbot grating interferometry used to characterize these lenses for the first time revealed excellent focusing properties and minimal wavefront distortions. Using a specific lens pair designed for 20 keV x rays, short-exposure times, and image registration with a cross-correlation technique, we circumvent vibrational instabilities to obtain distortion-free images with a uniform resolution of 240 nm (smallest resolvable line pair) over a large FOV, 80 × 80 µm² in extent. The results were contrasted with those collected using commercial two-dimensional parabolic lenses with a smaller FOV. This approach implemented on a diffractometer would enable diffraction-contrast or dark-field microscopy for fast observations of “mesoscopic” phenomena in real space complementing reciprocal-space studies using diffraction on the same instrument.

Dark-field X-ray microscopy is a lens-based technique that enables real-space imaging of heterogeneous micro- and meso-scale ordered materials. However, achieving accurate three-dimensional (3D) reconstruction often requires meticulous sample alignment or rastering, requiring complex rotational setups and extended acquisition times. To address these challenges, we introduce a structured illumination technique optimized for 3D imaging of ordered materials at sub-micrometer length scales. Our approach employs a coded aperture to spatially modulate the incident X-ray beam, enabling 3D structural reconstruction from images captured at various aperture positions. Unlike current 3D imaging approaches, which often rely on rotational or rastering methods, our technique uses scanning X-ray silhouettes of the coded aperture for depth resolution along the diffraction axis. This eliminates the need for sample rotation or rastering, resulting in a highly stable and efficient imaging modality. We validated the efficacy of this approach through experimental imaging of an isolated twin domain within a bulk single crystal of an iron pnictide using a dark-field X-ray microscope. This advancement aligns with the enhanced brightness upgrades of modern synchrotron radiation facilities, unlocking new possibilities for high-resolution imaging of ordered materials.

The aperture of refractive X-ray lenses is limited by absorption and geometry. We introduce a specific simulation method to develop an aperture-optimized lens design for hard X-ray full field microscopy. The aperture-optimized lens, referred to as Taille-lens, allows for high spatial resolution as well as homogeneous image quality. This is achieved by the individual adaptation of the apertures of hundreds of lens elements of an X-ray imaging lens to the respective microscopy setup. For full field microscopy, the simulations result in lenses with both a large entrance and exit aperture and lens elements with smaller apertures in the middle of the lens.

X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga K_α-line and compared to a ray-tracing simulation of the setup.

Clinical diagnostic x-ray imaging is currently based on the principle of differences of x-ray attenuation between tissues. Whereas attenuation contrast is often insufficient to allow differentiation between tissues such as cancer lesions in soft tissue or pathologic changes in the lung, research points to phase-contrast, and dark-field x-ray imaging as an option to overcome this limitation, with clinical^{1 – 5} as well as industrial applicability.⁶ Currently, the most promising technology to do phase contrast and dark-field imaging is interferometry using a Talbot–Lau interferometer, which requires microstructured gratings.^7,8

Recent developments in X-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field X-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films prove challenging due to available detection methods and incident X-ray flux at the sample. We present a direct detection method developed in conjunction with KAImaging which focuses on DFXM studies in the hard X-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator-based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.