Yaqiu Li

Yaqiu Li


Research Focus & Metrics

Academic Career Length

11Years (2016-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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7 January 2025 in IISE Transactions
Verified
Journal Article
Open access
QZQingqing Zhai
Qingqing Zhai
YLYaqiu Li
Yaqiu Li
PCPiao Chen
Piao Chen

10 February 2023 in Engineering Failure Analysis
Verified
Journal Article
Closed access
GPGuangze Pan
Guangze Pan
XDXiaojian Ding
Xiaojian Ding
DLDan Li
Dan Li
YLYaqiu Li
Yaqiu Li
YWYuanhang Wang
Yuanhang Wang

16 February 2023 in Engineering Failure Analysis
Verified
Journal Article
Closed access
GPGuangze Pan
Guangze Pan
GGGuangkuo Guo
Guangkuo Guo
DLDan Li
Dan Li
YLYaqiu Li
Yaqiu Li
QLQian Li
Qian Li
WLWenwei Liu
Wenwei Liu

24 October 2016 in Materials
Verified
Journal Article
Open access
PDF file
WHWeiwei Hu
Weiwei Hu
YLYaqiu Li
Yaqiu Li
YSYufeng Sun
Yufeng Sun
AMAli Mosleh
Ali Mosleh
Accurate testing history data is necessary for all fatigue life prediction approaches, but such data is always deficient especially for the microelectronic devices. Additionally, the sequence of the individual load cycle plays an important role in physical fatigue damage. However, most of the existing models based on the linear damage accumulation rule ignore the sequence effects. This paper proposes a thermal fatigue life prediction model for ball grid array (BGA) packages to take into consideration the load sequence effects. For the purpose of improving the availability and accessibility of testing data, a new failure criterion is discussed and verified by simulation and experimentation. The consequences for the fatigue underlying sequence load conditions are shown.

1 September 2018 in Microelectronics Reliability
Verified
Journal Article
Closed access
ZYZhipeng Ye
Zhipeng Ye
JZJiawei Zhu
Jiawei Zhu
QLQian Li
Qian Li
BMBing Mo
Bing Mo
BLBaimao Lei
Baimao Lei
CHChuangmian Huang
Chuangmian Huang

5 June 2023 in Sustainability
Verified
Journal Article
Open access
PDF file
HZHongbin Zhang
Hongbin Zhang
SLShuqiang Liu
Shuqiang Liu
PLPeibo Liang
Peibo Liang
ZYZhipeng Ye
Zhipeng Ye
YLYaqiu Li
Yaqiu Li
In the realm of industrial automation, corrosion represents one of the primary modes of failure, especially in the case of armored thermocouples exposed to temperatures ranging between 1073.15–1373.15 K. In this context, the selection of metal materials that can withstand high-temperature oxidation and corrosion is of paramount importance. Typically, the corrosion resistance of a given metal material is assessed by measuring the “annual corrosion rate” or “corrosion depth”, which can provide an estimated life expectancy value. However, such an approach fails to account for the individual characteristics of the material, and thus does not conform to objective laws. Rather, the corrosion life of a batch of metallic materials should follow the Weibull distribution, or possibly a normal distribution, as per recent studies that have examined the high-temperature oxidation corrosion mechanism of machine or core components. This investigation effectively combines the standard approach for evaluating metal corrosion resistance in the field of materials with the method of assessing component life in the domain of reliability. Furthermore, we consider the individual differences among materials and provide the life distribution function of metals in corrosive environments and thereby refine the evaluation of metal corrosion resistance. This study ultimately establishes a thermocouple accelerated life evaluation model that enhances the accuracy and efficiency of life evaluations for related products.