Sihwan Kim

Mr. Sihwan Kim


Research Focus & Metrics

Academic Career Length

11Years (2016-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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Verified
Journal Article
Open access
PDF file
JHJennifer Hasler
Jennifer Hasler
SKSihwan Kim
Sihwan Kim
FAFarhan Adil
Farhan Adil
This paper presents scaling of Floating-Gate (FG) devices, and the resulting implication to large-scale Field Programmable Analog Arrays (FPAA) systems. The properties of FG circuits and systems in one technology (e.g., 350 nm CMOS) are experimentally shown to roughly translate to FG circuits in scaled down processes in a way predictable through MOSFET physics concepts. Scaling FG devices results in higher frequency response, (e.g., FPAA fabric) as well as lower parasitic capacitance and lower power consumption. FPAA architectures, limited to 50–100 MHz frequency ranges could be envisioned to operate at 500 MHz–1 GHz for 130 nm line widths, and operate around 4 GHz for 40 nm line widths.

6 July 2017 in IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Verified
Journal Article
Closed access
SKSihwan Kim
Sihwan Kim
SSSahil Shah
Sahil Shah
JHJennifer Hasler
Jennifer Hasler
We present a calibration flow for a large-scale floating-gate (FG) system-on-chip field programmable analog array. We focus on characterizing the FG programming infrastructure and hot-electron injection parameters, MOSFET parameters using the EKV model, and calibrating digital-analog converters and analog-digital converters. In addition, threshold voltage mismatches on FG devices due to their indirect structure are characterized using on-chip measurement techniques. The calibration results in enabling a digital approach, where a design can be programmed without having to deal with the local and global mismatches, on a reconfigurable analog system. This paper shows the results of a compiled nonlinear classifier block comprising a vector-matrix-multiplier and a winner-takes-all on three different calibrated chips.

22 March 2021 in Design Automation for Embedded Systems
Verified
Journal Article
Closed access
PDF file
SKSihwan Kim
Sihwan Kim
SSSahil Shah
Sahil Shah
RWRichard Wunderlich
Richard Wunderlich
JHJennifer Hasler
Jennifer Hasler

Verified
Journal Article
Open access
PDF file
JHJennifer Hasler
Jennifer Hasler
SSSahil Shah
Sahil Shah
SKSihwan Kim
Sihwan Kim
ILIshan Kumal Lal
Ishan Kumal Lal
JHJennifer Hasler
Jennifer Hasler
We present a novel remote test system, an integrated remote testing system requiring minimal technology support overhead, enabled by configurable analog–digital Integrated Circuits (IC) to create a simple interface for a wide range of experiments. Our remote test system requires no additional setup, resulting both from using highly configurable devices, as well as from the advancement of straight-forward digital interfaces (i.e., USB) for the resulting experimental system. The system overhead requirements require simple email handling, available over almost all network systems with no additional requirements. The system is empowered through large-scale Field Programmable Analog Array (FPAA) devices and Baseline Tool Framework (BTF), where we present a range of experimentally measured examples illustrating the range of user interfacing available for the remote user.

11 August 2016
Verified
Conference Paper
Closed access
SKSihwan Kim
Sihwan Kim
FAFarhan Adil
Farhan Adil
SKScott Koziol
Scott Koziol
SNStephen Nease
Stephen Nease
MCMichelle Collins
Michelle Collins
JHJennifer Hasler
Jennifer Hasler
This demonstration presents live hands-on experience of the System on Chip (SoC) large-scale Field Programmable Analog Array (FPAA) IC [1] through a complete PC Board and high-level tool interface [2]. Figure 1a shows the demonstration requires only basic power connection to the laptop. The hardware includes an FPAA demonstration board and a Digilent USB device to enable a scope / function generator functionality.