Prof. Dr. Ralf B. Bergmann studied physics in Heidelberg and Freiburg, both in Germany, and received his doctoral degree from the University of Stuttgart in 1991 for his work at the Max Planck Institute for Solid State Research (MPI-FKF), Stuttgart, Germany, concerning crystal growth and semiconductor physics and characterization. In 1991 he joined the University of New South Wales (UNSW) in Sydney, Australia and returned to the MPI-FKF in 1993 where he continued his work on thin film solar cells from UNSW and obtained his Habilitation in 1998 from the University of Freiburg in the area of Applied Crystallography and Material Science. From 1997 on, he worked at the University of Stuttgart, at the former Institute of Physical Electronics heading a research group on Crystalline Silicon. In 2001, he joined the Corporate Research Centre of the Robert Bosch Corp., Stuttgart, as head of the department of Applied Physics. From 2006 on he headed the Physical Analysis Lab within the business unit of Automotive Electronics of the Robert Bosch Corp. in Reutlingen, Germany. In 2008, he became a Professor at the University of Bremen, Germany, and a Director at the Institute of Applied Beam Technology in Bremen. His present research centers around optical metrology and optoelectronics including nano-optics and quantum sensors. .