Claas Falldorf

Dr. Claas Falldorf

BIAS - Bremer Institut für angewandte Strahltechnik GmbH, 28359 Bremen, Germany
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Research Focus & Metrics

Academic Career Length

24Years (2003-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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25 March 2010 in Applied Optics
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Journal Article
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CFClaas Falldorf
Claas Falldorf
MAMostafa Agour
Mostafa Agour
CKChristoph V. Kopylow
Christoph V. Kopylow
RBRalf Bernhard Bergmann
Ralf Bernhard Bergmann
We present an experimental configuration for phase retrieval from a set of intensity measurements. The key component is a spatial light modulator located in the Fourier domain of an imaging system. It performs a linear filter operation that is associated to the process of propagation in the image plane. In contrast to the state of the art, no mechanical adjustment is required during the recording process, thus reducing the measurement time considerably. The method is experimentally demonstrated by investigating a wave field scattered by a diffuser, and the results are verified by comparing them to those obtained from standard interferometry.

20 September 2014
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Book Chapter
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USUlf Schnars
Ulf Schnars
CFClaas Falldorf
Claas Falldorf
JWJohn Watson
John Watson
WJWerner Jüptner
Werner Jüptner

4 September 2013 in Journal of the Optical Society of America A
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CFClaas Falldorf
Claas Falldorf
CKChristoph von Kopylow
Christoph von Kopylow
RBRalf Bernhard Bergmann
Ralf Bernhard Bergmann
In this paper, we present a method to recover the complex amplitude of speckle fields from measurements performed by a shear interferometer. It is based on the optimization of an objective function using the steepest descent gradient technique in combination with a heuristic initial guess. In contrast to already existing methods, the algorithm finds a local minimum least-squares solution even in the presence of Poissonian and Gaussian noise.

4 September 2009 in Optics Letters
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CFClaas Falldorf
Claas Falldorf
SOStefan Osten
Stefan Osten
CKChristoph V. Kopylow
Christoph V. Kopylow
WJWerner Jüptner
Werner Jüptner
We present a shearing interferometer that is based on the birefringent properties of a phase-only spatial light modulator. The main advantages of this approach are the high flexibility, the robustness, and the light efficiency. In contrast to already existing methods the suppression of unwanted diffraction orders is not required.

30 November 2012 in Applied Optics
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CFClaas Falldorf
Claas Falldorf
SLSilke Huferath-Von Luepke
Silke Huferath-Von Luepke
CKChristoph von Kopylow
Christoph von Kopylow
RBRalf Bernhard Bergmann
Ralf Bernhard Bergmann
We report on a method that can be used to improve the result of multiwavelength contouring in the case of objects with rough surface. It is based on the combined evaluation of multiple measurements with varying direction of illumination. While the individual measurements share the same systematics with respect to the shape of the investigated object, the noise arising from speckle decorrelation fluctuates statistically and hence can be reduced by means of averaging. For the case of three illumination directions we show that weighted averaging of the measured phase distributions enhances the signal-to-noise ratio by approximately 3 dB.

6 July 2007 in Applied Optics
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Journal Article
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CFClaas Falldorf
Claas Falldorf
YHYvonne Heimbach
Yvonne Heimbach
CKChristoph von Kopylow
Christoph von Kopylow
WJWerner Jüptner
Werner Jüptner
We present a method that allows the reconstruction of smooth phase distributions from their laterally sheared representation. The proposed approach is efficient in the sense that only one sheared distribution is needed to completely restore the signal. A mandatory requirement is that the phase distribution is spatially limited. The method is exemplified by means of a synthetic signal, and in addition a practical algorithm is given. Finally, experimental results are presented. The deformation of a metallic surface is investigated by both speckle shearography and electronic speckle pattern interferometry (ESPI) respectively. To give proof of the proposed technique, the phase distribution reconstructed from the shearographic measurement is shown to match the results obtained by the ESPI.