Adrian Sulich

Dr. Adrian Sulich

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Research Focus & Metrics

Academic Career Length

13Years (2014-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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20 July 2021 in Materials
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SMSushma Mishra
Sushma Mishra
EPEwa Przeździecka
Ewa Przeździecka
WWWojciech Wozniak
Wojciech Wozniak
Abinash AdhikariAbinash Adhikari
Abinash Adhikari
RJRafał Jakieła
Rafał Jakieła
EGElżbieta Guziewicz
Elżbieta Guziewicz
The structural, optical, and electrical properties of ZnO are intimately intertwined. In the present work, the structural and transport properties of 100 nm thick polycrystalline ZnO films obtained by atomic layer deposition (ALD) at a growth temperature (Tg) of 100–300 °C were investigated. The electrical properties of the films showed a dependence on the substrate (a-Al2O3 or Si (100)) and a high sensitivity to Tg, related to the deviation of the film stoichiometry as demonstrated by the RT-Hall effect. The average crystallite size increased from 20–30 nm for as grown samples to 80–100 nm after rapid thermal annealing, which affects carrier scattering. The ZnO layers deposited on silicon showed lower strain and dislocation density than on sapphire at the same Tg. The calculated half crystallite size (D/2) was higher than the Debye length (LD) for all as grown and annealed ZnO films, except for annealed ZnO/Si films grown within the ALD window (100–200 °C), indicating different homogeneity of charge carrier distribution for annealed ZnO/Si and ZnO/a-Al2O3 layers. For as grown films the hydrogen impurity concentration detected via secondary ion mass spectrometry (SIMS) was 1021 cm−3 and was decreased by two orders of magnitude after annealing, accompanied by a decrease in Urbach energy in the ZnO/a-Al2O3 layers.

19 February 2020 in Journal of Applied Physics
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EPEwa Przeździecka
Ewa Przeździecka
EGElżbieta Guziewicz
Elżbieta Guziewicz
DJDawid Jarosz
Dawid Jarosz
DSD. Snigurenko
D. Snigurenko
ASAdrian Sulich
Adrian Sulich
WPWojciech Paszkowicz
Wojciech Paszkowicz
Understanding the origin of the strong difference of electrical parameters between as grown and annealed undoped ZnO films prepared at a temperature range of 100–200 °C by thermal atomic layer deposition is essential for their future applications. In this paper, we show that the conductivity drop by up to 4 orders of magnitude as effect of post-growth annealing is accompanied by multiple simultaneous effects like a two orders of magnitude decrease of hydrogen impurity content, a strong width reduction of the luminescence peaks, and an increase of crystallite sizes influencing the carrier scattering. We show that a level of structural and optical improvement as well as the final electrical parameters of annealed films strongly depend on the previously employed growth temperature, which is related to transition from oxygen- to zinc-rich conditions influencing a type and concentration of native point defects. The growth temperature does not only influence the bandgap energy but also the binding energies of existing donors and the relative ratio between the number of donors and acceptors; hence, it determines the final electrical characteristics of the films. This means that electrical properties of undoped ZnO-atomic layer deposition films can be tuned by native defects engineering.

17 March 2017 in Crystals
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LGL. V. Gudzenko
L. V. Gudzenko
MKM. B. Kosmyna
M. B. Kosmyna
ASAlexey Shekhovtsov
Alexey Shekhovtsov
WPWojciech Paszkowicz
Wojciech Paszkowicz
ASAdrian Sulich
Adrian Sulich
SSS. A. Skrobov
S. A. Skrobov
Crystal growth and thermal properties of binary borates, Ca3RE2(BO3)4 (RE = Y, Gd, Nd), are considered promising crystals for laser applications. These single crystals were grown by the Czochralski method. The crystal and defect structure were characterized. Volumetric chemical methods without prior separation of the components were developed and applied for the determination of the dependence of chemical compositions of the crystals on the growth conditions. The thermal conductivity was investigated in the 50–300 K range. The character of the temperature dependence of thermal conductivity was found to be similar to that of glass. The possible reasons of the observed features of the thermal conductivity were analyzed.

5 January 2022 in Journal of Materials Chemistry C
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ASAdrian Sulich
Adrian Sulich
EŁElżbieta Łusakowska
Elżbieta Łusakowska
WWWojciech Wołkanowicz
Wojciech Wołkanowicz
PDPiotr Dziawa
Piotr Dziawa
JSJanusz Sadowski
Janusz Sadowski
JDJaroslaw Z. Domagala
Jaroslaw Z. Domagala

Challenges and opportunities arising from molecular beam epitaxial growth of topological crystalline insulator heterostructures composed of a rock-salt SnTe(001) layer of varying thickness (from 80 nm to 1000 nm) and a zinc blende 4 μm thick CdTe(001) buffer layer grown on a commercial GaAs(001) substrate with 2° off-cut toward the [100] direction were studied with a focus on crystal lattice strain, unit cell symmetry breaking and surface quality. The results indicate that the CdTe buffer is almost fully relaxed whereas in SnTe layers slight anisotropic relaxation is observed that varies from 86.2% to 98.3% with the layer thickness increasing. The relaxation process involves formation of misfit dislocations, mainly of Lomer-type (consisting of two associated 60° dislocations), both at CdTe/GaAs and SnTe/CdTe interfaces. Azimuthal spatial distribution of defects is anisotropic due to a disparity of 60° dislocation mobility toward orthogonal [−110] and [110] crystallographic directions. This results in a monoclinic distortion of the SnTe unit cell, as observed especially in the layers grown without additional Te molecular flux. A reflections selection method is proposed to measure such crystal deformations. Qualitatively new morphology of the SnTe surface of a reduced symmetry with nanoripple-like structures oriented close to the 〈100〉 (or, rarely, to 〈120〉) crystallographic in-plane direction is observed. The possible mechanism of their formation is dislocation-driven while their extended shape and predominant crystalline orientation may be influenced by the anisotropy of defect azimuthal distribution. Due to the magnitude of measured lattice strain (∼10−3) the monoclinic distortion in SnTe(001) layers is expected to be large enough to affect their physical properties, e.g., offering the way of controlling the crystal-symmetry-protected surface states (deformation-induced opening of the energy gap in the spectrum of metallic topological surface states). Thus, it may serve as an additional degree of freedom in designing topological spintronic devices.


16 February 2014 in Journal of Radioanalytical and Nuclear Chemistry
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ASAdrian Sulich
Adrian Sulich
JGJ. Grodkowski
J. Grodkowski
JMJ. Mirkowski
J. Mirkowski
RKR. Kocia
R. Kocia

23 November 2018 in Journal of Physics D: Applied Physics
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ASAdrian Sulich
Adrian Sulich
JDJaroslaw Z Domagala
Jaroslaw Z Domagala
JHJurgen Haertwig
Jurgen Haertwig
ASAlexey Shekhovtsov
Alexey Shekhovtsov
MKMiron Kosmyna
Miron Kosmyna
WPWojciech Paszkowicz
Wojciech Paszkowicz
Pure and Nd-doped Ca 3 Y 2 (BO 3 ) 4 and Ca 3 Gd 2 (BO 3 ) 4 orthoborate (space group Pnma ) single crystals are considered for applications as materials for optoelectronics, in particular for ultrafast pulse lasers. In the present work, Czochralski-grown single crystals of such materials were studied. All of them were nearly free of defects such as impurity phases or gas bubble inclusions, previously observed and reported in similar orthoborates. Laboratory high-resolution x-ray diffraction together with synchrotron radiation-based white-beam x-ray topography have been employed as experimental techniques. In this paper we perform for the first time a systematic study of extended defects present in those crystals, including the spatial distribution of the defects. The crystal quality of the studied Ca 3 RE 2 (BO 3 ) 4 samples is relatively good—the mean values of double-axis rocking-curve full width at half maximum are low enough low (in the order of 32–131 arcsec) and comparable with literature results obtained for other borate crystals. The chemical composition is generally uniform along the samples. The nature of the extended defects is recognized—they are mainly crystal blocks with low misorientation angles ⩽0.06°), micromosaics, dislocations, and crystallographic plane bending. A detailed analysis of the bend for each crystal is presented. Simple criteria for classifying bulk crystals in terms of bending profile are formulated.