We present a hybrid antireflective coating (ARC) providing a complete continuous graded refractive index (GRIN) transition from a high-index substrate down to ambient air. The ARC comprises a first GRIN layer of dense silicon-oxy-nitride with a varying, height adjusted material composition. Secondly, a layer of quasi-periodic nanopillars imitating AR-“moth-eye structure” is added to the dense GRIN layer. Demonstrated on a high index glass with a refractive index of n_e=1.73 the hybrid GRIN-ARC is applicable to a broad material selection and allows to eliminate any step-like transition up to a refractive index of the substrate of ∼2.0. The ARC offers antireflective properties for large incidence angles and over an extremely broad spectrum ranging from 400 nm up to 2.5 µm. Compared to the sole substrate, the hybrid GRIN-ARC results in an increase of transmittance of more than 10% in the maximum, and more than 6% in the peripheral regions of the spectrum.

The concept of a new compact echelle-inspired cross-grating spectrometer is introduced, and a specific optical design is presented. The new concept aims to achieve simultaneously a high spectral resolution, a wide accessible spectral range, and compact dimensions. The essential system novelty concerns the combination of different aspects: the implementation of a crossed grating comprising both the main dispersion and order separation, a folded reflective beam path, which enables a reduction of the system volume, and the introduction of a form-adjustable mirror for aberration compensation. The exemplary optical design offers a spectral bandwidth ranging from 330–1100 nm with spectral resolution better than 1.4 nm in the fourth and 0.4 nm in the 11th order. The optical setup covers a volume of $110\mathrm{mm}\times 110\mathrm{mm}\times 30\mathrm{mm}$.

The concept and the implementation of a compact and simplified echelle spectrometer are presented, and the working principle is demonstrated by first experimental measurements. The crucial element of the setup is a cross-grating, combining an echelle grating utilizing several higher diffraction orders (5th up to 11th) and a superposed perpendicular-oriented cross-dispersing grating. Two alternative manufacturing approaches for the cross-grating are presented and discussed. The first approach combines Talbot lithography for the deep echelle grating and interference lithography for the cross-dispersing structure. As a second approach, direct laser-beam writing was applied. The compact echelle spectrometer covers a spectral range from 380 to 700 nm and offers a spectral resolution of $\sim 2\mathrm{nm}$.

The majority of spectrometers use reflective dispersion gratings with a metal-coated blazed grating profile for spectral decomposition. They achieve high diffraction efficiency at the design wavelength, which decays considerably in the adjacent longer and shorter wavelength ranges. We introduce a structured metal double-blazed grating with a high diffraction efficiency for a broadband spectral range, consisting of a sawtooth-like structured metal surface filled with a first dielectric transparent material. The planarized upper surface is covered with a second blazed profile of a different transparent material. We present a systematical theoretical analysis of the diffraction efficiency in reflection geometry, based on a scalar approach involving fundamental dispersion parameters such as Abbe numbers and relative partial dispersions of the materials. We find material combinations reducing the profile heights down to 1–2 µm.

Optical interferometric sensors have acquired significant importance in metrology and information technology, especially in terms of their potential application in launching size, selectivity, sensitivity, resolution, spectral tuning ranges, efficiency, and cost. However, these demands are often contradictory and counteract one another, and are thus difficult to simultaneously fulfill during their interaction. This review focuses on a detailed comparison of seven different strongly miniaturized sensor concepts investigating the limits of these demands. For the visible and near-infrared spectral range, seven optical sensors were reviewed based on the following methodologies: classical optical transmission and reflection gratings, arrayed waveguide gratings, static Fabry–Pérot (FP) filter arrays, MEMS tunable FP interferometers, MEMS tunable photonic crystals, plasmonic filters, and fiber tip sensors. The comparison between the selected concepts concentrates on (i) the minimum space required for a particular spectral range, (ii) resolution, (iii) the integration in optical fiber technology, (iv) tunability to save space, (v) efficiency in using available light, (vi) multiplexing, (vii) miniaturization limits, and (viii) the potential of nanoimprint for cost reduction. Technologies for enhancing efficiency to obtain more available light and their applicability to the different methodologies were studied.

This contribution presents the design and implementation of a compact and robust Echelle-inspired cross-grating spectrometer which is arranged as a double pass setup. This allows use of the employed refractive elements for collimation of the incoming light and, after diffraction at the reflective crossed diffraction grating, for imaging the diffracted light onto the detector. The crossed diffraction grating combines the two dispersive functionalities of a classical Echelle spectrometer in a single element and is therefore formed by a superposition of two blazed linear gratings which are oriented perpendicularly. The refractive elements and the plane grating are arranged in a rigid objective group which is beneficial in terms of stability and robustness. The experimental tests prove that the designed resolving power of more than 300 is achieved for the addressed spectrum ranging from 400 nm to 1100 nm by using an entrance pinhole diameter of 105 µm. The utilization of a single mode fiber increases the resolving power to more than 1000, but leads to longer acquisition times.