An explicit charge-based solution for the drain current, terminal charges and intrinsic capacitance of a long-channel junctionless nanowire transistor (JNT) incorporating the importance of an interface trap density that affect the threshold voltage and the subthreshold slope is presented in this study. Initially, a continuous implicit solution of the unified charge-based control model (UCCM) is derived from the 1D Poisson equation by invoking the parabolic potential approximation. The the continuous solution of the mobile charge density at the source/drain is obtained by adding the decoupled UCCM expression for the depletion and complementary parts, where each part is explicitly solved using the Lambert function without having an additional smoothing function to unify the two limits. The omission of an additional smoothing function could lead to a shorter computation time. Secondly, by solving Pao-Sah’s dual integral, a continuous charge-based expression for the drain current is derived. The expressions for the terminal charge are then derived based on the decoupled drain current model that also becomes an input for computing all four independent capacitances of the JNT. The explicit continuous models show a good agreement with numerical simulation over practical terminal voltages, doping levels, and geometry effects. For a given maximum surface potential error of 5%, the model is accurate for a dopant-geometry ratio of 0.001 < qN _D R ² /4 ϵ _Si < 0.3 and it is also independent of fitting parameters that may vary for different terminal biases or dopant geometries. The nonpiecewise models for drain current, terminal charges and intrinsic capacitance are significantly resolved by decoupling the mobile charge into depletion and complementary parts with no additional smoothing function to unify between operating regions, and omitting fitting parameters that have no physical meaning.

In this study, a set of new analytical models to predict and investigate the impacts of gas adsorption on the electronic band structure and electrical transport properties of the single-wall carbon nanotube field-effect transistor (SWCNT-FET) based gas sensor are proposed. The sensing mechanism is based on introducing new hopping energy and on-site energy parameters for gas-carbon interactions representing the charge transfer between gas molecules (CO2, NH3, and H2O) and the hopping energies between carbon atoms of the CNT and gas molecule. The modeling starts from the atomic level to the device level using the tight-binding technique to formulate molecular adsorption effects on the energy band structure, density of states, carrier velocity, and I-V characteristics. Therefore, the variation of the energy bandgap, density of states and current-voltage properties of the CNT sensor in the presence of the gas molecules is discovered and discussed. The simulated results show that the proposed analytical models can be used with an electrical CNT gas sensor to predict the behavior of sensing mechanisms in gas sensors.

Recent advances in nanotechnology have revealed the superiority of nanocarbon species such as carbon nanotubes over other conventional materials for gas sensing applications. In this work, analytical modeling of the semiconducting zigzag carbon nanotube field-effect transistor (ZCNT-FET) based sensor for the detection of gas molecules is demonstrated. We propose new analytical models to strongly simulate and investigate the physical and electrical behavior of the ZCNT sensor in the presence of various gas molecules (CO₂, H₂O, and CH₄). Therefore, we start with the modeling of the energy band structure by acquiring the new energy dispersion relation for the ZCNT and introducing the gas adsorption effects to the band structure model. Then, the electrical conductance of the ZCNT is modeled and formulated while the gas adsorption effect is considered in the conductance model. The band structure analysis indicates that, the semiconducting ZCNT experiences band gap variation after the adsorption of the gases. Furthermore, the bandgap variation influences the conductance of the ZCNT and the results exhibit increments of the ZCNT conductance in the presence of target gases while the minimum conductance shifted upward around the neutrality point. Besides, the I-V characteristics of the sensor are extracted from the conductance model and its variations after adsorption of different gas molecules are monitored and investigated. To verify the accuracy of the proposed models, the conductance model is compared with previous experimental and modeling data and a good consensus is observed. It can be concluded that the proposed analytical models can successfully be applied to predict sensor behavior against different gas molecules.

Two-dimensional material hexagonal boron nitride (h-BN), and its one-dimensional thin strips, boron nitride nanoribbons (BNNRs) are electrically insulating with high thermal stability, making them excellent thermal conductors suitable for high-temperature application. BNNRs are wide bandgap semiconductors with bandgaps ranging from 4 to 6 eV. This study investigates the electronic properties of BNNRs with single vacancy defects in armchair and zigzag configurations. The nearest-neighbour tight-binding model and numerical method were used to simulate the electronic properties of BNNRs with a single vacancy, including band structure and local density of states. The alpha and beta matrices were adjusted to account for missing boron or nitrogen atoms. Furthermore, a small perturbations were introduced to model the effects of impurities and edge imperfections. The simulation result from this work was compared with pristine BNNRs to examine the impact of a single vacancy on their electronic properties. The findings reveal that both armchair and zigzag BNNRs with single vacancy defects exhibit distorted band structures and local density of states due to the delocalization of p_z orbitals. The valence bands show a higher concentration of nitrogen, while the conduction bands are richer in boron. These findings provide insights into how vacancy defects and edge perturbations can influence the electronic properties of BNNRs, which can guide the design and optimization of BNNR-based electronic devices in future research.

Molybdenum disulfide (MoS₂) has distinctive electronic and mechanical properties which make it a highly prospective material for use as a channel in upcoming nanoelectronic devices. An analytical modeling framework was used to investigate the I–V characteristics of field-effect transistors based on MoS₂. The study begins by developing a ballistic current equation using a circuit model with two contacts. The transmission probability, which considers both the acoustic and optical mean free path, is then derived. Next, the effect of phonon scattering on the device was examined by including transmission probabilities into the ballistic current equation. According to the findings, the presence of phonon scattering caused a decrease of 43.7% in the ballistic current of the device at room temperature when L = 10 nm. The influence of phonon scattering became more prominent as the temperature increased. In addition, this study also considers the impact of strain on the device. It is reported that applying compressive strain could increase the phonon scattering current by 13.3% at L = 10 nm at room temperature, as evaluated in terms of the electrons’ effective masses. However, the phonon scattering current decreased by 13.3% under the same condition due to the existence of tensile strain. Moreover, incorporating a high-k dielectric to mitigate the impact of scattering resulted in an even greater improvement in device performance. Specifically, at L = 6 nm, the ballistic current was surpassed by 58.4%. Furthermore, the study achieved SS = 68.2 mV/dec using Al₂O₃ and an on–off ratio of 7.75 × 10⁴ using HfO₂. Finally, the analytical results were validated with previous works, showing comparable agreement with the existing literature.

Moore’s Law is approaching its end as transistors are scaled down to tens or few atoms per device, researchers are actively seeking for alternative approaches to leverage more-than-Moore nanoelectronics. Substituting the channel material of a field-effect transistors (FET) with silicene is foreseen as a viable approach for future transistor applications. In this study, we proposed a SPICE-compatible model for p-type (Aluminium) uniformly doped silicene FET for digital switching applications. The performance of the proposed device is benchmarked with various low-dimensional FETs in terms of their on-to-off current ratio, subthreshold swing and drain-induced barrier lowering. The results show that the proposed p-type silicene FET is comparable to most of the selected low-dimensional FET models. With its decent performance, the proposed SPICE-compatible model should be extended to the circuit-level simulation and beyond in future work.