Kevin Ruwisch

Mr. Kevin Ruwisch

orcid

Research Focus & Metrics

Academic Career Length

9Years (2018-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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24 September 2021 in Sensors
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GGGasper Glavan
Gasper Glavan
IBInna A. Belyaeva
Inna A. Belyaeva
KRKevin Ruwisch
Kevin Ruwisch
JWJoachim Wollschläger
Joachim Wollschläger
Mikhail ShamoninMikhail Shamonin
Mikhail Shamonin
The voltage response to pulsed uniform magnetic fields and the accompanying bending deformations of laminated cantilever structures are investigated experimentally in detail. The structures comprise a magnetoactive elastomer (MAE) slab and a commercially available piezoelectric polymer multilayer. The magnetic field is applied vertically and the laminated structures are customarily fixed in the horizontal plane or, alternatively, slightly tilted upwards or downwards. Six different MAE compositions incorporating three concentrations of carbonyl iron particles (70 wt%, 75 wt% and 80 wt%) and two elastomer matrices of different stiffness are used. The dependences of the generated voltage and the cantilever’s deflection on the composition of the MAE layer and its thickness are obtained. The appearance of the voltage between the electrodes of a piezoelectric material upon application of a magnetic field is considered as a manifestation of the direct magnetoelectric (ME) effect in a composite laminated structure. The ME voltage response increases with the increasing total quantity of the soft-magnetic filler in the MAE layer. The relationship between the generated voltage and the cantilever’s deflection is established. The highest observed peak voltage around 5.5 V is about 8.5-fold higher than previously reported values. The quasi-static ME voltage coefficient for this type of ME heterostructures is about 50 V/A in the magnetic field of ≈100 kA/m, obtained for the first time. The results could be useful for the development of magnetic field sensors and energy harvesting devices relying on these novel polymer composites.

18 January 2022 in Physical Review B
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TPTobias Pohlmann
Tobias Pohlmann
MHMartin Hoppe
Martin Hoppe
JTJannis Thien
Jannis Thien
ADArka Bikash Dey
Arka Bikash Dey
AAAndreas Alexander
Andreas Alexander
FBFlorian Bertram
Florian Bertram
We present time-resolved high-energy x-ray diffraction, time-resolved hard-x-ray photoelectron spectroscopy (tr-HAXPES), and time-resolved grazing incidence small-angle x-ray scattering (tr-GISAXS) data of the reactive molecular beam epitaxy of Fe3O4 ultrathin films on various substrates. Reciprocal space maps are recorded during the deposition of Fe3O4 on SrTiO3(001), MgO(001), and NiO/MgO(001) in order to observe the thickness-dependent evolution of Bragg reflections sensitive to the octahedral and tetrahedral sublattices of the inverse spinel structure of Fe3O4. Rock salt and spinel-exclusive reflections appear at different thicknesses, revealing that first, the iron oxide film grows with Fe1−δO rock salt structure with exclusive occupation of octahedral lattice sites. After reaching a film thickness of 1.1nm, further growth of the iron oxide film proceeds in the inverse spinel structure, with both octahedral and tetrahedral lattice sites being occupied. In addition, iron oxide on SrTiO3(001) initially grows with none of these structures. Here, the formation of the rock salt structure starts when reaching a film thickness of 1.5nm. This is confirmed by tr-HAXPES data obtained during growth of iron oxide on SrTiO3(001), which demonstrate an excess of Fe2+ cations compared to Fe3O4 in growing films thinner than 3.2nm. This rock salt phase only appears during growth and vanishes after the supply of the Fe molecular beam is stopped. Thus, it can be concluded that the rock salt structure of the interlayer is a property of the dynamic growth process while the film is still exposed to oxygen. The tr-GISAXS data link these structural results to an island growth mode of the first 2–3 nm on both MgO(001) and SrTiO3(001) substrates.

17 April 2024 in Nanomaterials
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JRJari Rodewald
Jari Rodewald
JTJannis Thien
Jannis Thien
KRKevin Ruwisch
Kevin Ruwisch
TPTobias Pohlmann
Tobias Pohlmann
MHMartin Hoppe
Martin Hoppe
JWJoachim Wollschläger
Joachim Wollschläger
Off-stoichiometric NixFe3−xO4 ultrathin films (x < 2.1) with varying Ni content x and thickness 16 (±2) nm were grown on MgO(001) by reactive molecular beam epitaxy. Synchrotron-based high-resolution X-ray diffraction measurements reveal vertical compressive strain for all films, resulting from a lateral pseudomorphic adaption of the film to the substrate lattice without any strain relaxation. Complete crystallinity with smooth interfaces and surfaces is obtained independent of the Ni content x. For x < 1 an expected successive conversion from Fe3O4 to NiFe2O4 is observed, whereas local transformation into NiO structures is observed for films with Ni content x > 1. However, angle-resolved hard X-ray photoelectron spectroscopy measurements indicate homogeneous cationic distributions without strictly separated phases independent of the Ni content, while X-ray absorption spectroscopy shows that also for x > 1, not all Fe2+ cations are substituted by Ni2+ cations. The ferrimagnetic behavior, as observed by superconducting quantum interference device magnetometry, is characterized by decreasing saturation magnetization due to the formation of antiferromagnetic NiO parts.

22 December 2021 in Materials
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JTJannis Thien
Jannis Thien
JBJascha Bahlmann
Jascha Bahlmann
AAAndreas Alexander
Andreas Alexander
KRKevin Ruwisch
Kevin Ruwisch
JRJari Rodewald
Jari Rodewald
KKKarsten Küpper
Karsten Küpper
Here, we present the (element-specific) magnetic properties and cation ordering for ultrathin Co-rich cobalt ferrite films. Two Co-rich CoxFe3−xO4 films with different stoichiometry (x=1.1 and x=1.4) have been formed by reactive solid phase epitaxy due to post-deposition annealing from epitaxial CoO/Fe3O4 bilayers deposited before on Nb-doped SrTiO3(001). The electronic structure, stoichiometry and homogeneity of the cation distribution of the resulting cobalt ferrite films were verified by angle-resolved hard X-ray photoelectron spectroscopy. From X-ray magnetic circular dichroism measurements, the occupancies of the different sublattices were determined using charge-transfer multiplet calculations. For both ferrite films, a partially inverse spinel structure is found with increased amount of Co3+ cations in the low-spin state on octahedral sites for the Co1.4Fe1.6O4 film. These findings concur with the results obtained by superconducting quantum interference device measurements. Further, the latter measurements revealed the presence of an additional soft magnetic phase probably due to cobalt ferrite islands emerging from the surface, as suggested by atomic force microscope measurements.

30 June 2018 in Materials
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OKOlga Kuschel
Olga Kuschel
NPNico Pathé
Nico Pathé
TSTobias Schemme
Tobias Schemme
KRKevin Ruwisch
Kevin Ruwisch
JRJari Rodewald
Jari Rodewald
JWJoachim Wollschläger
Joachim Wollschläger
We present a comparative study of the morphology and structural as well as magnetic properties of crystalline Fe3O4/NiO bilayers grown on both MgO(001) and SrTiO3(001) substrates by reactive molecular beam epitaxy. These structures were investigated by means of X-ray photoelectron spectroscopy, low-energy electron diffraction, X-ray reflectivity and diffraction, as well as vibrating sample magnetometry. While the lattice mismatch of NiO grown on MgO(001) was only 0.8%, it was exposed to a lateral lattice mismatch of −6.9% if grown on SrTiO3. In the case of Fe3O4, the misfit strain on MgO(001) and SrTiO3(001) amounted to 0.3% and −7.5%, respectively. To clarify the relaxation process of the bilayer system, the film thicknesses of the magnetite and nickel oxide films were varied between 5 and 20 nm. While NiO films were well ordered on both substrates, Fe3O4 films grown on NiO/SrTiO3 exhibited a higher surface roughness as well as lower structural ordering compared to films grown on NiO/MgO. Further, NiO films grew pseudomorphic in the investigated thickness range on MgO substrates without any indication of relaxation, whereas on SrTiO3 the NiO films showed strong strain relaxation. Fe3O4 films also exhibited strong relaxation, even for films of 5 nm thickness on both NiO/MgO and NiO/SrTiO3. The magnetite layers on both substrates showed a fourfold magnetic in-plane anisotropy with magnetic easy axes pointing in 100 directions. The coercive field was strongly enhanced for magnetite grown on NiO/SrTiO3 due to the higher density of structural defects, compared to magnetite grown on NiO/MgO.

27 June 2022 in Physical Review B
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Journal Article
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TPTobias Pohlmann
Tobias Pohlmann
FBFlorian Bertram
Florian Bertram
JTJannis Thien
Jannis Thien
JRJari Rodewald
Jari Rodewald
KRKevin Ruwisch
Kevin Ruwisch
JWJoachim Wollschläger
Joachim Wollschläger
We present an investigation on the structural and magnetic properties of the interfaces of Fe3O4/MgO(001) and Fe3O4/NiO/MgO(001) by extracting cation-selective magneto-optical depth profiles by means of x-ray resonant magnetic reflectivity in combination with charge-transfer multiplet simulations of x-ray magnetic circular dichroism data. For Fe3O4/MgO(001), the magneto-optical depth profiles at the Feoct2+ and the Feoct3+ resonant energies follow exactly the structural profile, while the magneto-optical depth profile at the Fetet3+ resonance is offset by 3.2±1.3 Å from the interface, consistent with a B-site interface termination of Fe3O4 with fully intact magnetic order. In contrast, for Fe3O4/NiO(001), the magneto-optical depth profiles at the Feoct2+ and the Ni2+ resonances agree with the structural profile, but the interface positions of the magneto-optical depth profiles at the Feoct3+ and the Fetet3+ resonances are spatially shifted by 3.3±1.4 and 2.7±0.9 Å, respectively, not consistent with a magnetically ordered stoichiometric interface. This may be related to an intermixed (Ni,Fe)O layer at the interface. The dichroic depth profile at the Ni L3 edge might hint at uncompensated magnetic moments throughout the NiO film.